skip to content
Defects in SiO₂ and related dielectrics : science and technology Preview this item
ClosePreview this item
Checking...

Defects in SiO₂ and related dielectrics : science and technology

Author: G Pacchioni; L Skuja; David L Griscom
Publisher: Dordrecht, Netherlands ; Boston, MA : Kluwer Academic Publishers, ©2000.
Series: NATO science series., Series II,, Mathematics, physics, and chemistry ;, v. 2.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: G Pacchioni; L Skuja; David L Griscom
ISBN: 0792366859 9780792366850
OCLC Number: 45102948
Description: viii, 624 pages : illustrations ; 24 cm.
Contents: Defect-free vitreous networks: The idealised structure of SiO[subscript 2] and related glasses / A.C. Wright --
Topology and topological disorder in silica / L.W. Hobbs and X. Yuan --
Optical properties of defects in silica / L. Skuja --
The nature of point defects in amorphous silicon dioxide / D.L. Griscom --
Ab initio theory of point defects in SiO[subscript 2] / G. Pacchioni --
A demi-century of magnetic defects in [alpha]-quartz / J.A. Weil --
Interaction of SiO[subscript 2] glasses with high energy ion beams and vacuum UV excimer laser pulses / H. Hosono and K. Kawamura --
Excitons, localized states in silicon dioxide and related crystals and glasses / A.N. Trukhin --
Gamma rays induced conversion of native defects in natural silica / F.M. Gelardi and S. Agnello --
Ge and Sn doping in silica: structural changes, optically active defects, paramagnetic sites / A. Paleari --
Computational studies of self-trapped excitons in silica / L.R. Corrales, J. Song and R.M. VanGinhoven / [and others] --
Defects on activated silica surface / V.A. Radzig --
Ab-initio molecular dynamics simulation of amorphous silica surface / M. Bernasconi --
Periodic UV-induced index modulations in doped-silica optical fibers: formation and properties of the fiber Bragg grating / C.G. Askins --
Bulk silicas prepared by low pressure plasma CVD: formation of structure and point defects / K.M. Golant. Change of spectroscopic and structural properties of germanosilicate glass under mechanical compression and UV irradiation / V.M. Mashinsky --
UV photoinduced phenomena in oxygen-deficient silica glasses / A. Rybaltovskii --
One- and two-quantum UV photo-reactions in pure and doped silica glasses. 2. Germanium oxygen deficient centers (GODC) / V.N. Bagratashvili, S.I. Tsypina and P.V. Chernov / [and others] --
Photoinduced refractive index change and second harmonic generation in MCVD germanosilicate core fibres fabricated in reduced (nitrogen and helium) atmospheres / E.M. Dianov, A.N. Guryanov and V.F. Khopin / [et al.] --
Molecular hydrogen interaction kinetics of interfacial Si dangling bonds in thermal (111)Si/SiO[subscript 2]. An electron spin resonance saga / A.L. Stesmans --
Ultrathin oxide films for advanced gate dielectrics applications. Current progress and future challenges / E.P. Gusev --
SiC/SiO[subscript 2] interface defects / V.V. Afanas'ev --
Point defects in Si-SiO[subscript 2] systems: current understanding / S.P. Karna, H.A. Kurtz and A.C. Pineda / [et al.].
Series Title: NATO science series., Series II,, Mathematics, physics, and chemistry ;, v. 2.
Responsibility: edited by G. Pacchioni, L. Skuja, D.L. Griscom.
More information:

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/45102948> # Defects in SiO₂ and related dielectrics : science and technology
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "45102948" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/144784948#Place/boston_ma> ; # Boston, MA
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mau> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/144784948#Place/dordrecht_netherlands> ; # Dordrecht, Netherlands
    schema:about <http://experiment.worldcat.org/entity/work/data/144784948#Topic/silice_proprietes_electriques_congres> ; # Silice--Propriétés électriques--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/144784948#Topic/crystals_defects> ; # Crystals--Defects
    schema:about <http://experiment.worldcat.org/entity/work/data/144784948#Topic/verre_de_silice_congres> ; # Verre de silice--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/144784948#Topic/cristaux_defauts_congres> ; # Cristaux--Défauts--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/144784948#Topic/silica_electric_properties> ; # Silica--Electric properties
    schema:about <http://id.worldcat.org/fast/1118589> ; # Silica--Electric properties
    schema:about <http://id.worldcat.org/fast/884675> ; # Crystals--Defects
    schema:about <http://dewey.info/class/548.85/e21/> ;
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/40600952> ; # Linards Skuja
    schema:contributor <http://viaf.org/viaf/6387106> ; # David L. Griscom
    schema:contributor <http://experiment.worldcat.org/entity/work/data/144784948#Meeting/nato_advanced_study_institute_on_defects_in_sio2_and_related_dielectrics_science_and_technology_2000_erice_italy> ; # NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology (2000 : Erice, Italy)
    schema:contributor <http://viaf.org/viaf/56688337> ; # Gianfranco Pacchioni
    schema:copyrightYear "2000" ;
    schema:datePublished "2000" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/144784948> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/144784948#Series/nato_science_series_series_ii_mathematics_physics_and_chemistry> ; # NATO science series. Series II, Mathematics, physics, and chemistry ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/144784948#Series/nato_science_series> ; # NATO science series.
    schema:name "Defects in SiO₂ and related dielectrics : science and technology"@en ;
    schema:productID "45102948" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/45102948#PublicationEvent/dordrecht_netherlands_boston_ma_kluwer_academic_publishers_2000> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/144784948#Agent/kluwer_academic_publishers> ; # Kluwer Academic Publishers
    schema:url <http://catdir.loc.gov/catdir/enhancements/fy0814/00048787-t.html> ;
    schema:workExample <http://worldcat.org/isbn/9780792366850> ;
    umbel:isLike <http://bnb.data.bl.uk/id/resource/GBA107810> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/45102948> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/144784948#Agent/kluwer_academic_publishers> # Kluwer Academic Publishers
    a bgn:Agent ;
    schema:name "Kluwer Academic Publishers" ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Meeting/nato_advanced_study_institute_on_defects_in_sio2_and_related_dielectrics_science_and_technology_2000_erice_italy> # NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology (2000 : Erice, Italy)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/144784948#Place/erice_italy> ; # Erice, Italy)
    schema:name "NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology (2000 : Erice, Italy)" ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Place/dordrecht_netherlands> # Dordrecht, Netherlands
    a schema:Place ;
    schema:name "Dordrecht, Netherlands" ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Place/erice_italy> # Erice, Italy)
    a schema:Place ;
    schema:name "Erice, Italy)" ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Series/nato_science_series> # NATO science series.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/45102948> ; # Defects in SiO₂ and related dielectrics : science and technology
    schema:name "NATO science series." ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Series/nato_science_series_series_ii_mathematics_physics_and_chemistry> # NATO science series. Series II, Mathematics, physics, and chemistry ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/45102948> ; # Defects in SiO₂ and related dielectrics : science and technology
    schema:name "NATO science series. Series II, Mathematics, physics, and chemistry ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Topic/cristaux_defauts_congres> # Cristaux--Défauts--Congrès
    a schema:Intangible ;
    schema:name "Cristaux--Défauts--Congrès"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Topic/silice_proprietes_electriques_congres> # Silice--Propriétés électriques--Congrès
    a schema:Intangible ;
    schema:name "Silice--Propriétés électriques--Congrès"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/144784948#Topic/verre_de_silice_congres> # Verre de silice--Congrès
    a schema:Intangible ;
    schema:name "Verre de silice--Congrès"@en ;
    .

<http://id.worldcat.org/fast/1118589> # Silica--Electric properties
    a schema:Intangible ;
    schema:name "Silica--Electric properties"@en ;
    .

<http://id.worldcat.org/fast/884675> # Crystals--Defects
    a schema:Intangible ;
    schema:name "Crystals--Defects"@en ;
    .

<http://viaf.org/viaf/40600952> # Linards Skuja
    a schema:Person ;
    schema:familyName "Skuja" ;
    schema:givenName "Linards" ;
    schema:givenName "L." ;
    schema:name "Linards Skuja" ;
    .

<http://viaf.org/viaf/56688337> # Gianfranco Pacchioni
    a schema:Person ;
    schema:birthDate "1954" ;
    schema:familyName "Pacchioni" ;
    schema:givenName "Gianfranco" ;
    schema:givenName "G." ;
    schema:name "Gianfranco Pacchioni" ;
    .

<http://viaf.org/viaf/6387106> # David L. Griscom
    a schema:Person ;
    schema:familyName "Griscom" ;
    schema:givenName "David L." ;
    schema:name "David L. Griscom" ;
    .

<http://worldcat.org/isbn/9780792366850>
    a schema:ProductModel ;
    schema:isbn "0792366859" ;
    schema:isbn "9780792366850" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.