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Design and analysis of integrator-based log-domain filter circuits

Author: Gordon W Roberts; Vincent W Leung
Publisher: New York : Kluwer Academic, ©2002.
Series: International series in engineering and computer science., Analog circuits and signal processing ;, 534.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Roberts, Gordon W., 1959-
Design and analysis of integrator-based log-domain filter circuits.
New York : Kluwer Academic, ©2002
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Gordon W Roberts; Vincent W Leung
ISBN: 0306470543 9780306470547 9780306475443 0306475448
OCLC Number: 50174980
Description: 1 online resource (xxiii, 254 pages) : illustrations.
Series Title: International series in engineering and computer science., Analog circuits and signal processing ;, 534.
Responsibility: Gordon W. Roberts and Vincent W. Leung.

Abstract:

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

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Primary Entity

<http://www.worldcat.org/oclc/50174980> # Design and analysis of integrator-based log-domain filter circuits
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
    library:oclcnum "50174980" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://experiment.worldcat.org/entity/work/data/1054937#Topic/bipolar_integrated_circuits_design_and_construction> ; # Bipolar integrated circuits--Design and construction
    schema:about <http://dewey.info/class/621.3815324/e21/> ;
    schema:about <http://id.worldcat.org/fast/1017641> ; # Metal oxide semiconductors, Complementary--Design and construction
    schema:about <http://id.worldcat.org/fast/832872> ; # Bipolar integrated circuits--Design and construction
    schema:about <http://id.loc.gov/authorities/subjects/sh2008107701> ; # Metal oxide semiconductors, Complementary--Design and construction
    schema:about <http://experiment.worldcat.org/entity/work/data/1054937#Topic/technology_&_engineering_electronics_circuits_integrated> ; # TECHNOLOGY & ENGINEERING--Electronics--Circuits--Integrated
    schema:about <http://experiment.worldcat.org/entity/work/data/1054937#Topic/log_domain_filters_design_and_construction> ; # Log domain filters--Design and construction
    schema:about <http://id.worldcat.org/fast/904529> ; # Electric circuit analysis
    schema:about <http://id.loc.gov/authorities/subjects/sh85041607> ; # Electric circuit analysis
    schema:about <http://experiment.worldcat.org/entity/work/data/1054937#Topic/technology_&_engineering_electronics_circuits_general> ; # TECHNOLOGY & ENGINEERING--Electronics--Circuits--General
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/273798090> ; # Vincent W. Leung
    schema:copyrightYear "2002" ;
    schema:creator <http://viaf.org/viaf/115299925> ; # Gordon W. Roberts
    schema:datePublished "2002" ;
    schema:description "Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1054937> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://worldcat.org/issn/0893-3405> ; # International series in engineering and computer science.
    schema:isSimilarTo <http://worldcat.org/entity/work/data/1054937#CreativeWork/design_and_analysis_of_integrator_based_log_domain_filter_circuits> ;
    schema:name "Design and analysis of integrator-based log-domain filter circuits"@en ;
    schema:productID "50174980" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/50174980#PublicationEvent/new_york_kluwer_academic_2002> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1054937#Agent/kluwer_academic> ; # Kluwer Academic
    schema:url <http://link.springer.com/10.1007/b117772> ;
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=67555> ;
    schema:url <http://uiwtx.idm.oclc.org/login?url=http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=67555> ;
    schema:url <http://dx.doi.org/10.1007/b117472> ;
    schema:url <http://www.springerlink.com/content/978-0-7923-8699-5/> ;
    schema:url <http://dx.doi.org/10.1007/b117772> ;
    schema:workExample <http://worldcat.org/isbn/9780306475443> ;
    schema:workExample <http://worldcat.org/isbn/9780306470547> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/50174980> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/1054937#Agent/kluwer_academic> # Kluwer Academic
    a bgn:Agent ;
    schema:name "Kluwer Academic" ;
    .

<http://experiment.worldcat.org/entity/work/data/1054937#Topic/bipolar_integrated_circuits_design_and_construction> # Bipolar integrated circuits--Design and construction
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85014273> ;
    schema:name "Bipolar integrated circuits--Design and construction"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1054937#Topic/log_domain_filters_design_and_construction> # Log domain filters--Design and construction
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh99011776> ;
    schema:name "Log domain filters--Design and construction"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1054937#Topic/technology_&_engineering_electronics_circuits_general> # TECHNOLOGY & ENGINEERING--Electronics--Circuits--General
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Electronics--Circuits--General"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1054937#Topic/technology_&_engineering_electronics_circuits_integrated> # TECHNOLOGY & ENGINEERING--Electronics--Circuits--Integrated
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Electronics--Circuits--Integrated"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2008107701> # Metal oxide semiconductors, Complementary--Design and construction
    a schema:Intangible ;
    schema:name "Metal oxide semiconductors, Complementary--Design and construction"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85041607> # Electric circuit analysis
    a schema:Intangible ;
    schema:name "Electric circuit analysis"@en ;
    .

<http://id.worldcat.org/fast/1017641> # Metal oxide semiconductors, Complementary--Design and construction
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh2008107701> ; # Metal oxide semiconductors, Complementary--Design and construction
    schema:name "Metal oxide semiconductors, Complementary--Design and construction"@en ;
    .

<http://id.worldcat.org/fast/832872> # Bipolar integrated circuits--Design and construction
    a schema:Intangible ;
    schema:name "Bipolar integrated circuits--Design and construction"@en ;
    .

<http://id.worldcat.org/fast/904529> # Electric circuit analysis
    a schema:Intangible ;
    schema:name "Electric circuit analysis"@en ;
    .

<http://viaf.org/viaf/115299925> # Gordon W. Roberts
    a schema:Person ;
    schema:birthDate "1959" ;
    schema:familyName "Roberts" ;
    schema:givenName "Gordon W." ;
    schema:name "Gordon W. Roberts" ;
    .

<http://viaf.org/viaf/273798090> # Vincent W. Leung
    a schema:Person ;
    schema:familyName "Leung" ;
    schema:givenName "Vincent W." ;
    schema:name "Vincent W. Leung" ;
    .

<http://worldcat.org/entity/work/data/1054937#CreativeWork/design_and_analysis_of_integrator_based_log_domain_filter_circuits>
    a schema:CreativeWork ;
    rdfs:label "Design and analysis of integrator-based log-domain filter circuits." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/50174980> ; # Design and analysis of integrator-based log-domain filter circuits
    .

<http://worldcat.org/isbn/9780306470547>
    a schema:ProductModel ;
    schema:isbn "0306470543" ;
    schema:isbn "9780306470547" ;
    .

<http://worldcat.org/isbn/9780306475443>
    a schema:ProductModel ;
    schema:isbn "0306475448" ;
    schema:isbn "9780306475443" ;
    .

<http://worldcat.org/issn/0893-3405> # International series in engineering and computer science.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/50174980> ; # Design and analysis of integrator-based log-domain filter circuits
    schema:issn "0893-3405" ;
    schema:name "International series in engineering and computer science." ;
    schema:name "The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing," ;
    .


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