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A designer's guide to built-in self-test

Author: Charles E Stroud
Publisher: Boston : Kluwer Academic Publishers, ©2002.
Series: Frontiers in electronic testing.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Stroud, Charles E.
Designer's guide to built-in self-test.
Boston : Kluwer Academic Publishers, ©2002
(DLC) 2002016230
(OCoLC)49356026
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Charles E Stroud
ISBN: 0306475049 9780306475047
OCLC Number: 51783984
Description: 1 online resource (xvi, 319 pages) : illustrations.
Contents: Preliminaries; Table of Contents; Preface; About the Author; 1. An Overview of BIST; 2. Fault Models, Detection, and Simulation; 3. Design for Testability; 4. Test Pattern Generation; 5. Output Response Analysis; 6. Manufacturing and System-Level Use of BIST; 7. Built-In Logic Block Observer; 8. Pseudo-Exhaustive BIST; 9. Circular BIST; 10. Scan-Based BIST; 11. Non-Intrusive BIST; 12. BIST for Regular Structures; 13. BIST for FPGAs and CPLDs; 14. Applying Digital BIST to Mixed-Signal Systems; 15. Merging BIST and Concurrent Fault Detection; Acronyms; Bibliography; Index.
Series Title: Frontiers in electronic testing.
Responsibility: Charles E. Stroud.

Abstract:

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major  Read more...

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