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Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France

Author: Jean-Pierre ChatardP N J DennisSociety of Photo-optical Instrumentation Engineers.European Optical Society.Groupement des industries française d'optique.All authors
Publisher: Bellingham, Wash., USA : SPIE, ©2004.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5251.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Jean-Pierre Chatard; P N J Dennis; Society of Photo-optical Instrumentation Engineers.; European Optical Society.; Groupement des industries française d'optique.; Société française d'optique.
ISBN: 0819451355 9780819451354
OCLC Number: 54771271
Description: xxxi, 334 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5251.
Responsibility: Jean-Pierre Chatard, Peter N.J. Dennis, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, EOS--European Optical Society, GIFO--Groupement des Industries Française d'Optique, [and] SFO--Société Française d'Optique.

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