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Detectors for crystallography and diffraction studies at synchrotron sources

Author: George W Fraser; Conference on Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
Publisher: Bellingham, Wash. SPIE 1999
Series: SPIE proceedings series, 3774; Proceedings, SPIE, The International Society for Optical Engineering, 1982, 3774
Edition/Format:   Book : EnglishView all editions and formats
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Document Type: Book
All Authors / Contributors: George W Fraser; Conference on Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
ISBN: 0819432601 9780819432605
OCLC Number: 247364574
Description: V, 130 S
Series Title: SPIE proceedings series, 3774; Proceedings, SPIE, The International Society for Optical Engineering, 1982, 3774
Responsibility: [SPIE Conference on Detectors for Crystallography and Diffraction Studies at Synchrotron Sources], 19 July 1999, Denver, Colorado. Sponsored and publ. by SPIE, the International Society for Optical Engineering. George W. Fraser ..., chairs/ed
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