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Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA

Author: George F Vander Voort; John J Friel; International Metallographic Society. Technical Meeting
Publisher: Columbus, Ohio : International Metallographic Society ; Materials Park, Ohio : ASM International, ©1996.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Albuquerque (NM, 1995)
Congresses
Additional Physical Format: Online version:
Developments in materials characterization technologies.
Columbus, Ohio : International Metallographic Society ; Materials Park, Ohio : ASM International, ©1996
(OCoLC)605468359
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: George F Vander Voort; John J Friel; International Metallographic Society. Technical Meeting
ISBN: 087170580X 9780871705808
OCLC Number: 35128245
Description: vii, 125 p. : ill. ; 29 cm.
Contents: Multi-dimensional microanalysis in materials characterization: some case examples / Lawrence E. Murr [and others] --
Reflections on incident light microscopy / James H. Richardson --
Progress in characterizing materials using image analysis / George F. Vander Voort --
An experimental method for quantitative characterization of spatial distribution of fibers in composites / S. Yang, A. Tewari and A.M. Gokhale --
The continuing evolution of the SEM / Mel D. Ball --
Developments in energy-dispersive spectroscopy / John J. Friel --
Development of backscattered electron Kikuchi patterns for phase identification in the SEM / J.R. Michael and R.P. Goehner.
Responsibility: edited by George F. Vander Voort, John J. Friel.

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