skip to content
Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA Preview this item
ClosePreview this item
Checking...

Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA

Author: George F Vander Voort; John J Friel; International Metallographic Society. Technical Meeting
Publisher: Columbus, Ohio : International Metallographic Society ; Materials Park, Ohio : ASM International, ©1996.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Albuquerque (NM, 1995)
Congresses
Additional Physical Format: Online version:
Developments in materials characterization technologies.
Columbus, Ohio : International Metallographic Society ; Materials Park, Ohio : ASM International, ©1996
(OCoLC)605468359
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: George F Vander Voort; John J Friel; International Metallographic Society. Technical Meeting
ISBN: 087170580X 9780871705808
OCLC Number: 35128245
Description: vii, 125 pages : illustrations ; 29 cm
Contents: Multi-dimensional microanalysis in materials characterization: some case examples / Lawrence E. Murr [and others] --
Reflections on incident light microscopy / James H. Richardson --
Progress in characterizing materials using image analysis / George F. Vander Voort --
An experimental method for quantitative characterization of spatial distribution of fibers in composites / S. Yang, A. Tewari and A.M. Gokhale --
The continuing evolution of the SEM / Mel D. Ball --
Developments in energy-dispersive spectroscopy / John J. Friel --
Development of backscattered electron Kikuchi patterns for phase identification in the SEM / J.R. Michael and R.P. Goehner.
Responsibility: edited by George F. Vander Voort, John J. Friel.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/35128245> # Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "35128245" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/475095963#Place/materials_park_ohio> ; # Materials Park, Ohio
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/ohu> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/475095963#Place/columbus_ohio> ; # Columbus, Ohio
   schema:about <http://id.worldcat.org/fast/1011882> ; # Materials--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/475095963#Topic/kongress> ; # Kongress
   schema:about <http://id.worldcat.org/fast/1011856> ; # Materials--Microscopy
   schema:about <http://id.worldcat.org/fast/1017922> ; # Metallography
   schema:about <http://dewey.info/class/620.110287/e20/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/475095963#Topic/materials_testing> ; # Materials--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/475095963#Topic/metallographie> ; # Metallographie
   schema:about <http://experiment.worldcat.org/entity/work/data/475095963#Topic/materials_microscopy> ; # Materials--Microscopy
   schema:about <http://id.worldcat.org/fast/1430903> ; # Nondestructive testing
   schema:about <http://experiment.worldcat.org/entity/work/data/475095963#Topic/metallography> ; # Metallography
   schema:about <http://experiment.worldcat.org/entity/work/data/475095963#Topic/nondestructive_testing> ; # Nondestructive testing
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/5108969> ; # George F. Vander Voort
   schema:contributor <http://viaf.org/viaf/149004588> ; # International Metallographic Society. Technical Meeting
   schema:contributor <http://viaf.org/viaf/28726665> ; # John J. Friel
   schema:copyrightYear "1996" ;
   schema:datePublished "1996" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/475095963> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Albuquerque (NM, 1995)"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/605468359> ;
   schema:name "Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA"@en ;
   schema:productID "35128245" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/35128245#PublicationEvent/columbus_ohio_international_metallographic_society_materials_park_ohio_asm_international_1996> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/475095963#Agent/asm_international> ; # ASM International
   schema:publisher <http://experiment.worldcat.org/entity/work/data/475095963#Agent/international_metallographic_society> ; # International Metallographic Society
   schema:workExample <http://worldcat.org/isbn/9780871705808> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/35128245> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/475095963#Agent/asm_international> # ASM International
    a bgn:Agent ;
   schema:name "ASM International" ;
    .

<http://experiment.worldcat.org/entity/work/data/475095963#Agent/international_metallographic_society> # International Metallographic Society
    a bgn:Agent ;
   schema:name "International Metallographic Society" ;
    .

<http://experiment.worldcat.org/entity/work/data/475095963#Place/materials_park_ohio> # Materials Park, Ohio
    a schema:Place ;
   schema:name "Materials Park, Ohio" ;
    .

<http://id.worldcat.org/fast/1011856> # Materials--Microscopy
    a schema:Intangible ;
   schema:name "Materials--Microscopy"@en ;
    .

<http://id.worldcat.org/fast/1011882> # Materials--Testing
    a schema:Intangible ;
   schema:name "Materials--Testing"@en ;
    .

<http://id.worldcat.org/fast/1017922> # Metallography
    a schema:Intangible ;
   schema:name "Metallography"@en ;
    .

<http://id.worldcat.org/fast/1430903> # Nondestructive testing
    a schema:Intangible ;
   schema:name "Nondestructive testing"@en ;
    .

<http://viaf.org/viaf/149004588> # International Metallographic Society. Technical Meeting
    a schema:Organization ;
   schema:name "International Metallographic Society. Technical Meeting" ;
    .

<http://viaf.org/viaf/28726665> # John J. Friel
    a schema:Person ;
   schema:familyName "Friel" ;
   schema:givenName "John J." ;
   schema:name "John J. Friel" ;
    .

<http://viaf.org/viaf/5108969> # George F. Vander Voort
    a schema:Person ;
   schema:familyName "Vander Voort" ;
   schema:givenName "George F." ;
   schema:name "George F. Vander Voort" ;
    .

<http://worldcat.org/isbn/9780871705808>
    a schema:ProductModel ;
   schema:isbn "087170580X" ;
   schema:isbn "9780871705808" ;
    .

<http://www.worldcat.org/oclc/605468359>
    a schema:CreativeWork ;
   rdfs:label "Developments in materials characterization technologies." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/35128245> ; # Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA
    .

<http://www.worldcat.org/title/-/oclc/35128245>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/35128245> ; # Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA
   schema:dateModified "2018-03-11" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.