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Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.

Author: Stella W Pang
Publisher: Pittsburgh, Pa. : Materials Research Society, 1996.
Series: Materials Research Society symposia proceedings, v. 406.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Summary:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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Genre/Form: Conference papers and proceedings
Boston (Mass., 1995)
Congresses
Additional Physical Format: Online version:
Diagnostic techniques for semiconductor materials processing II.
Pittsburgh, Pa. : Materials Research Society, 1996
(OCoLC)714674119
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Stella W Pang
ISBN: 1558993096 9781558993099
OCLC Number: 34191076
Description: xv, 585 pages : illustrations ; 24 cm.
Series Title: Materials Research Society symposia proceedings, v. 406.
Responsibility: editors, Stella W. Pang [and others].

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