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Diagnostics and applications of thin films : proceedings of the International Summer School, 27th May-5th June 1991, Chlum u Třeboně, Czechoslovakia

Author: Ludmila Eckertová; T Růžička
Publisher: Bristol ; Philadelphia : Institute of Physics Pub., ©1992.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

A review of recent developments in the field of thin film physics, its technology and applications. The volume includes methods and applications, results obtained using classical methods, and new  Read more...

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Genre/Form: Kongress
Conference papers and proceedings
Chlumec nad Cidlinou (1991)
Congresses
Additional Physical Format: Online version:
Diagnostics and applications of thin films.
Bristol ; Philadelphia : Institute of Physics Pub., ©1992
(OCoLC)610117224
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Ludmila Eckertová; T Růžička
ISBN: 0750301651 9780750301657
OCLC Number: 26261288
Description: xii, 314 pages : illustrations ; 24 cm
Contents: Transmission electron microscopy, L. Reimer; electron-probe microanalysis of thin films, J. Wernisch; low energy electron microscopy (abstract), E. Bauer; electron energy loss spectroscopy, E. Zeitler; structural surface measurements by back-scattered electrons, M. De Crescenzi; the Fourier transform of lattices, J. Komrska; X-ray diffraction structure analysis of thin films, V. Valvoda; scanning tunnelling microscopy, R.G. Pritchard et al; SIMS of thin films (abstract), R.E. Thurstand and H. Derbyshire; industrial film thickness measurements and methods, A. Neukermans; structure of discontinuous films - RHEED investigations, M. Gillet; catalysis on particle surfaces, N. Kruse; hard coatings, H.A. Jehn and B. Rother; thin film sensors, J. Muller; amorphous, microcrystalline and epitaxial silicon - preparations, characterization and properties, S. Veprek; semiconductors layers and interfaces in microelectronics (abstract), F. Koch; thin film analysis using electrons and ions - structural and compositional analysis by a combination of microscopy and spectroscopy, R. Anton; crystal growth and recrystallization during structure evolution of thin films, P.B. Barna.
Responsibility: edited by L. Eckertová and T. Růžička.
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