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Digital circuit testing : a guide to DFT and other techniques

Author: Francis C Wang
Publisher: San Diego : Academic Press, ©1991.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

Technological advances in the electronics industry have made it difficult to access test nodes. New testing methods are needed and increasingly emphasis is placed on the development of such methods.  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Francis C Wang
ISBN: 0127345809 9780127345802
OCLC Number: 22984341
Description: xi, 233 pages : illustrations ; 24 cm
Contents: A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.
Responsibility: Francis C. Wang.
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"The text, Digital Circuit Testing: A Guide to DFT and Other Techniques, introduces the reader to the whole spectrum of digital test technology, covering some facets in more detail than Read more...

 
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