skip to content
Digital holography for MEMS and microsystem metrology Preview this item
ClosePreview this item
Checking...

Digital holography for MEMS and microsystem metrology

Author: Anand Asundi
Publisher: Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, ©2011.
Series: Wiley microsystem and nanotechnology series.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and  Read more...

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Anand Asundi
ISBN: 9780470978696 0470978694 9781119997290 1119997291
OCLC Number: 707247969
Description: xxii, 205 pages : illustrations ; 24 cm.
Contents: Introduction / Anand Asundi --
Digital reflection holography and applications / Vijay R. Singh, Anand Asundi --
Digital transmission holography and applications / Qu Weijuan --
Digital in-line holography and applications / Taslima Khanam --
Other applications : Recording plane division multiplexing (RDM) in digital holography for resolution enhancement / Caojin Yuan, Hongchen Zhai : Development of digital holographic tomography / Yu Yingjie : Digital holographic interferometry for phase distribution measurement / Jianlin Zhao --
Conclusion / Anand Asundi.
Series Title: Wiley microsystem and nanotechnology series.
Responsibility: edited by Anand Asundi.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.

Similar Items

Related Subjects:(4)

User lists with this item (5)

Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/707247969> # Digital holography for MEMS and microsystem metrology
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "707247969" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1005012399#Place/hoboken_n_j> ; # Hoboken, N.J.
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1005012399#Place/chichester_west_sussex_u_k> ; # Chichester, West Sussex, U.K.
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/1005012399#Topic/microelectromechanical_systems_measurement> ; # Microelectromechanical systems--Measurement
    schema:about <http://dewey.info/class/621.381/e22/> ;
    schema:about <http://id.worldcat.org/fast/967508> ; # Image processing--Digital techniques
    schema:about <http://id.loc.gov/authorities/subjects/sh85064447> ; # Image processing--Digital techniques
    schema:about <http://id.worldcat.org/fast/958936> ; # Holographic testing
    schema:about <http://experiment.worldcat.org/entity/work/data/1005012399#Topic/microelectronics_measurement> ; # Microelectronics--Measurement
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/270045010> ; # Anand Asundi
    schema:copyrightYear "2011" ;
    schema:datePublished "2011" ;
    schema:description "Introduction / Anand Asundi -- Digital reflection holography and applications / Vijay R. Singh, Anand Asundi -- Digital transmission holography and applications / Qu Weijuan -- Digital in-line holography and applications / Taslima Khanam -- Other applications : Recording plane division multiplexing (RDM) in digital holography for resolution enhancement / Caojin Yuan, Hongchen Zhai : Development of digital holographic tomography / Yu Yingjie : Digital holographic interferometry for phase distribution measurement / Jianlin Zhao -- Conclusion / Anand Asundi."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1005012399> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/1005012399#Series/wiley_microsystem_and_nanotechnology_series> ; # Wiley microsystem and nanotechnology series.
    schema:name "Digital holography for MEMS and microsystem metrology"@en ;
    schema:productID "707247969" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/707247969#PublicationEvent/chichester_west_sussex_u_k_hoboken_n_j_wiley_2011> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1005012399#Agent/wiley> ; # Wiley
    schema:url <http://onlinelibrary.wiley.com/book/10.1002/9781119997290> ;
    schema:workExample <http://worldcat.org/isbn/9781119997290> ;
    schema:workExample <http://worldcat.org/isbn/9780470978696> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/707247969> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1005012399#Place/chichester_west_sussex_u_k> # Chichester, West Sussex, U.K.
    a schema:Place ;
    schema:name "Chichester, West Sussex, U.K." ;
    .

<http://experiment.worldcat.org/entity/work/data/1005012399#Place/hoboken_n_j> # Hoboken, N.J.
    a schema:Place ;
    schema:name "Hoboken, N.J." ;
    .

<http://experiment.worldcat.org/entity/work/data/1005012399#Series/wiley_microsystem_and_nanotechnology_series> # Wiley microsystem and nanotechnology series.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/707247969> ; # Digital holography for MEMS and microsystem metrology
    schema:name "Wiley microsystem and nanotechnology series." ;
    schema:name "Wiley microsystem and nanotechnology series" ;
    .

<http://experiment.worldcat.org/entity/work/data/1005012399#Topic/microelectromechanical_systems_measurement> # Microelectromechanical systems--Measurement
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh97007351> ;
    schema:name "Microelectromechanical systems--Measurement"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85064447> # Image processing--Digital techniques
    a schema:Intangible ;
    schema:name "Image processing--Digital techniques"@en ;
    .

<http://id.worldcat.org/fast/958936> # Holographic testing
    a schema:Intangible ;
    schema:name "Holographic testing"@en ;
    .

<http://id.worldcat.org/fast/967508> # Image processing--Digital techniques
    a schema:Intangible ;
    schema:name "Image processing--Digital techniques"@en ;
    .

<http://viaf.org/viaf/270045010> # Anand Asundi
    a schema:Person ;
    schema:familyName "Asundi" ;
    schema:givenName "Anand" ;
    schema:name "Anand Asundi" ;
    .

<http://worldcat.org/isbn/9780470978696>
    a schema:ProductModel ;
    schema:isbn "0470978694" ;
    schema:isbn "9780470978696" ;
    .

<http://worldcat.org/isbn/9781119997290>
    a schema:ProductModel ;
    schema:isbn "1119997291" ;
    schema:isbn "9781119997290" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.