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Digital holography for MEMS and microsystem metrology

Author: Anand Asundi
Publisher: Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, ©2011.
Series: Wiley microsystem and nanotechnology series.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:

By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Anand Asundi
ISBN: 9780470978696 0470978694 9781119997290 1119997291
OCLC Number: 707247969
Description: xxii, 205 pages : illustrations ; 24 cm.
Contents: Introduction / Anand Asundi --
Digital reflection holography and applications / Vijay R. Singh, Anand Asundi --
Digital transmission holography and applications / Qu Weijuan --
Digital in-line holography and applications / Taslima Khanam --
Other applications : Recording plane division multiplexing (RDM) in digital holography for resolution enhancement / Caojin Yuan, Hongchen Zhai : Development of digital holographic tomography / Yu Yingjie : Digital holographic interferometry for phase distribution measurement / Jianlin Zhao --
Conclusion / Anand Asundi.
Series Title: Wiley microsystem and nanotechnology series.
Responsibility: edited by Anand Asundi.
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