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Digital microfluidic biochips : synthesis, testing, and reconfiguration techniques
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Digital microfluidic biochips : synthesis, testing, and reconfiguration techniques

著者: Krishnendu Chakrabarty; Fei Su
出版商: Boca Raton, FL : CRC/Taylor & Francis, ©2007.
版本/格式:   图书 : 英语查看所有的版本和格式
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Focuses on the automated design of microfluidic-based biochips for large-scale bioassays and safety-critical applications. This book presents a system-level design automation framework that addresses  再读一些...

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材料类型: 互联网资源
文件类型: 书, 互联网资源
所有的著者/提供者: Krishnendu Chakrabarty; Fei Su
ISBN: 0849390095 9780849390098
OCLC号码: 69792553
描述: 228 p. : ill. ; 25 cm.
内容: PART I SYNTHESIS TECHNIQUES Introduction Technology Issues Digital Microfluidic Biochips Microfluidic Biochip Design Challenges Book Outline Architectural-Level Synthesis Background High-Level Synthesis Methodology Simulation Experiments Module Placement Background Module Placement Problem Fault Tolerance for Digital Microfluidic Biochips Experimental Evaluation Unified Synthesis Methodology Problem Formulation PRSA-Based Algorithm Enhancement for Defect Tolerance Experimental Evaluation Droplet Routing Background Problem Formulation Routing Method Experimental Evaluation PART II TESTING TECHNIQUES Test Methodology Background Classification of Faults Unified Detection Mechanism Parametric Fault Testing Simulation Experimental Setup Test Planning Problem Definition Analysis of Computational Complexity Integer Linear Programming Model for OPP Heuristic Algorithms Simulation Results Concurrent Testing Concurrent Testing Methodology Optimal Scheduling for Concurrent Testing Concurrent Testing Example Defect-Oriented Testing and Diagnosis Fault Modeling Defect-Oriented Experiment Testing and Diagnosis Real-Life Application PART III RECONFIGURATION TECHNIQUES Reconfiguration Schemes Proposed Reconfiguration Schemes Example Evaluation Defect Tolerance Based on Space Redundancy Background Microfluidic Array with Hexagonal Electrodes Defect-Tolerant Designs Estimation of Yield Enhancement Evaluation Example Defect Tolerance Based on Graceful Degradation Tile-Based Architecture Clustered Defect Model Graceful Degradation with Reconfiguration Simulation Results Conclusions and Future Work Contributions of the Book Future Work Bibliography Index
责任: Krishnendu Chakrabarty, Fei Su.
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