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Digital noise monitoring of defect origin

Author: T A Aliev
Publisher: Berlin : Springer, ©2007.
Series: Lecture notes in electrical engineering, v. 2.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:
"Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of  Read more...
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: T A Aliev
ISBN: 0387717536 9780387717531
OCLC Number: 153582157
Notes: Book is intended for teachers, post-graduate students, and university students of all professions except the humanities. It deals with signals and noises at the output of sensors for both technical and biological objects at the origin of a defect.
Description: xii, 223 pages : illustrations ; 24 cm.
Contents: Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.
Series Title: Lecture notes in electrical engineering, v. 2.
Responsibility: Telman Aliev.
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Abstract:

Explores the initial stage of the origin of the defect taking into account technical, and biological features of several technologies. This book discusses monitoring the defect origin, identification  Read more...

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From the reviews: "The monograph builds on a long series of publications by the author over the last decade. ... monograph should benefit researchers and practicing engineers ... particularly those Read more...

 
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