skip to content
Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States Preview this item
ClosePreview this item
Checking...

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States

Author: Kevin G Harding; Tōru Yoshizawa; Zhang Song; SPIE (Society),
Publisher: Bellingham, Washington : SPIE, [2015] ©2015
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 9489.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Electronic books
Congresses
Additional Physical Format: Print version:
(OCoLC)921979486
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Kevin G Harding; Tōru Yoshizawa; Zhang Song; SPIE (Society),
ISBN: 9781628416053 162841605X
OCLC Number: 922006642
Description: 1 online resource : illustrations (some color).
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 9489.
Other Titles: Dimensional optical metrology and inspection for practical applications 4
Dimensional optical metrology and inspection for practical applications four
Responsibility: Kevin G. Harding, Toru Yoshizawa, Song Zhang, editors ; sponsored and published by SPIE.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.

Similar Items

Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/922006642> # Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States
    a schema:CreativeWork, schema:MediaObject, schema:Book ;
    library:oclcnum "922006642" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/2595101804#Topic/optical_measurements> ; # Optical measurements
    schema:alternateName "Dimensional optical metrology and inspection for practical applications 4" ;
    schema:alternateName "Dimensional optical metrology and inspection for practical applications four" ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://experiment.worldcat.org/entity/work/data/2595101804#Organization/spie_society> ; # SPIE (Society),
    schema:copyrightYear "2015" ;
    schema:datePublished "2015" ;
    schema:editor <http://experiment.worldcat.org/entity/work/data/2595101804#Person/song_zhang> ; # Zhang Song
    schema:editor <http://experiment.worldcat.org/entity/work/data/2595101804#Person/yoshizawa_toru_1939> ; # Tōru Yoshizawa
    schema:editor <http://experiment.worldcat.org/entity/work/data/2595101804#Person/harding_kevin_g> ; # Kevin G. Harding
    schema:exampleOfWork <http://worldcat.org/entity/work/id/2595101804> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Electronic books"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://worldcat.org/issn/0277-786X> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/921979486> ;
    schema:name "Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States"@en ;
    schema:productID "922006642" ;
    schema:url <http://uclibs.org/PID/281763> ;
    schema:url <http://liverpool.idm.oclc.org/login?url=http://proceedings.spiedigitallibrary.org/volume.aspx?volume=9489> ;
    schema:url <http://proceedings.spiedigitallibrary.org/volume.aspx?volume=9489> ;
    schema:workExample <http://worldcat.org/isbn/9781628416053> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/922006642> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/2595101804#Person/harding_kevin_g> # Kevin G. Harding
    a schema:Person ;
    schema:familyName "Harding" ;
    schema:givenName "Kevin G." ;
    schema:name "Kevin G. Harding" ;
    .

<http://experiment.worldcat.org/entity/work/data/2595101804#Person/song_zhang> # Zhang Song
    a schema:Person ;
    schema:familyName "Song" ;
    schema:givenName "Zhang" ;
    schema:name "Zhang Song" ;
    .

<http://experiment.worldcat.org/entity/work/data/2595101804#Person/yoshizawa_toru_1939> # Tōru Yoshizawa
    a schema:Person ;
    schema:birthDate "1939" ;
    schema:familyName "Yoshizawa" ;
    schema:givenName "Tōru" ;
    schema:name "Tōru Yoshizawa" ;
    .

<http://experiment.worldcat.org/entity/work/data/2595101804#Topic/optical_measurements> # Optical measurements
    a schema:Intangible ;
    schema:name "Optical measurements"@en ;
    .

<http://uclibs.org/PID/281763>
    rdfs:comment "SPIE. Restricted to UC campuses" ;
    .

<http://worldcat.org/isbn/9781628416053>
    a schema:ProductModel ;
    schema:isbn "162841605X" ;
    schema:isbn "9781628416053" ;
    .

<http://worldcat.org/issn/0277-786X> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/922006642> ; # Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States
    schema:issn "0277-786X" ;
    schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    schema:name "Proceedings of SPIE," ;
    .

<http://www.worldcat.org/oclc/921979486>
    a schema:CreativeWork ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/922006642> ; # Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States
    .

<http://www.worldcat.org/title/-/oclc/922006642>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/922006642> ; # Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States
    schema:dateModified "2018-12-01" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.