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DNA damage recognition

Author: Wolfram Siede; Yoke Wah Kow; Paul W Doetsch
Publisher: Boca Raton : Taylor & Francis, 2005.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:
"Covering a wide array of topics from bacteria to human cells, the book summarizes recent developments in DNA damage repair and recognition while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways."--Jacket.
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Wolfram Siede; Yoke Wah Kow; Paul W Doetsch
ISBN: 0824759613 9780824759612
OCLC Number: 60644864
Description: xxii, 845 pages : illustrations ; 26 cm
Contents: 1. Dynamics of DNA damage recognition / Eleanore Seibert, Roman Osman and J.B. Alexander Ross --
2. In search of damaged bases / R. Stephen Lloyd, A.K. McCullough and M.L. Dodson --
3. Increased specificity and efficiency of base excision repair through complex formation / Karen H. Almeida and Robert W. Sobol --
4. Structure and properties of DNA photoproducts / John-Stephen Taylor --
5. Damage recognition of DNA photolyases / Gwendolyn B. Sancar --
6. Damage recognition by the bacterial nucleotide excision repair machinery / Deborah L. Croteau, Matthew J. DellaVecchia, Milan Skorvaga and Bennett Van Houten --
7. Recognition of DNA damage during eukaryotic nucleotide excision repair / Hanspeter Naegeli.
Responsibility: [edited by] Wolfram Siede, Yoke Wah Kow, Paul W. Doetsch.
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Abstract:

Reviews the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. This work discusses the theoretical aspects of DNA  Read more...

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