skip to content
EEMTIC'81 digest : Electrical and Electronic Measurement and Test Instrument Conference and Exposition, Ottawa, Canada Preview this item
ClosePreview this item
Checking...

EEMTIC'81 digest : Electrical and Electronic Measurement and Test Instrument Conference and Exposition, Ottawa, Canada

Author: Canadian and U.S. URSI-Commission A.; IEEE Group on Instrumentation & Measurement.; Institute of Electrical and Electronics Engineers.; Institute of Electrical and Electronics Engineers. Ottawa Section.
Publisher: New York : Institute of Electrical and Electronics Engineers, ©1981.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Canadian and U.S. URSI-Commission A.; IEEE Group on Instrumentation & Measurement.; Institute of Electrical and Electronics Engineers.; Institute of Electrical and Electronics Engineers. Ottawa Section.
OCLC Number: 15921235
Notes: "81 CH1710-3"--Cover.
"Ottawa, Canada, 22, 23, 24, September 1981"--Cover.
Description: 10, 246 p. : ill. ; 22 cm.
Responsibility: sponsors, IEEE Ottawa Section, Instrumentation and Measurement Society, Canadian and U.S. URSI-Commission A.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/15921235> # EEMTIC'81 digest : Electrical and Electronic Measurement and Test Instrument Conference and Exposition, Ottawa, Canada
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "15921235" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/instruments_electroniques_congres> ; # Instruments électroniques--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/mesures_electroniques_congres> ; # Mesures électroniques--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/electronic_measurements_congresses> ; # Electronic measurements--Congresses
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/electronic_instruments_congresses> ; # Electronic instruments--Congresses
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/electronic_instruments> ; # Electronic instruments
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/electric_measurements_congresses> ; # Electric measurements--Congresses
    schema:about <http://dewey.info/class/621.381043/e19/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/testing> ; # Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/electric_measurements> ; # Electric measurements
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/testing_congresses> ; # Testing--Congresses
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/essais_technologie_congres> ; # Essais (Technologie)--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/11223203#Topic/electronic_measurements> ; # Electronic measurements
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://experiment.worldcat.org/entity/work/data/11223203#Organization/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/11223203#Organization/ieee_group_on_instrumentation_&_measurement> ; # IEEE Group on Instrumentation & Measurement.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/11223203#Organization/institute_of_electrical_and_electronics_engineers_ottawa_section> ; # Institute of Electrical and Electronics Engineers. Ottawa Section.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/11223203#Organization/canadian_and_u_s_ursi_commission_a> ; # Canadian and U.S. URSI-Commission A.
    schema:copyrightYear "1981" ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/11223203#Meeting/electrical_and_electronic_measurement_and_test_instrument_conference_and_exposition_1981_ottawa_ont> ; # Electrical and Electronic Measurement and Test Instrument Conference and Exposition (1981 : Ottawa, Ont.)
    schema:datePublished "1981" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/11223203> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:name "EEMTIC'81 digest : Electrical and Electronic Measurement and Test Instrument Conference and Exposition, Ottawa, Canada"@en ;
    schema:numberOfPages "246" ;
    schema:productID "15921235" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/15921235#PublicationEvent/new_york_institute_of_electrical_and_electronics_engineers_c1981> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/11223203#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/15921235> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
    schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Meeting/electrical_and_electronic_measurement_and_test_instrument_conference_and_exposition_1981_ottawa_ont> # Electrical and Electronic Measurement and Test Instrument Conference and Exposition (1981 : Ottawa, Ont.)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/11223203#Place/ottawa_ont> ; # Ottawa, Ont.)
    schema:name "Electrical and Electronic Measurement and Test Instrument Conference and Exposition (1981 : Ottawa, Ont.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Organization/canadian_and_u_s_ursi_commission_a> # Canadian and U.S. URSI-Commission A.
    a schema:Organization ;
    schema:name "Canadian and U.S. URSI-Commission A." ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Organization/ieee_group_on_instrumentation_&_measurement> # IEEE Group on Instrumentation & Measurement.
    a schema:Organization ;
    schema:name "IEEE Group on Instrumentation & Measurement." ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Organization/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers." ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Organization/institute_of_electrical_and_electronics_engineers_ottawa_section> # Institute of Electrical and Electronics Engineers. Ottawa Section.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers. Ottawa Section." ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Place/ottawa_ont> # Ottawa, Ont.)
    a schema:Place ;
    schema:name "Ottawa, Ont.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Topic/electric_measurements> # Electric measurements
    a schema:Intangible ;
    schema:name "Electric measurements"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Topic/electric_measurements_congresses> # Electric measurements--Congresses
    a schema:Intangible ;
    schema:name "Electric measurements--Congresses"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Topic/electronic_instruments> # Electronic instruments
    a schema:Intangible ;
    schema:name "Electronic instruments"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Topic/electronic_measurements> # Electronic measurements
    a schema:Intangible ;
    schema:name "Electronic measurements"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Topic/essais_technologie_congres> # Essais (Technologie)--Congrès
    a schema:Intangible ;
    schema:name "Essais (Technologie)--Congrès"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Topic/instruments_electroniques_congres> # Instruments électroniques--Congrès
    a schema:Intangible ;
    schema:name "Instruments électroniques--Congrès"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/11223203#Topic/mesures_electroniques_congres> # Mesures électroniques--Congrès
    a schema:Intangible ;
    schema:name "Mesures électroniques--Congrès"@fr ;
    .

<http://www.worldcat.org/title/-/oclc/15921235>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/15921235> ; # EEMTIC'81 digest : Electrical and Electronic Measurement and Test Instrument Conference and Exposition, Ottawa, Canada
    schema:dateModified "2018-05-04" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.