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Effect of resolution and image quality on combined optical and neural network fingerprint matching

Author: Cecil Leeburn Wilson; C I Watson; Eung Gi Paek; National Institute of Standards and Technology (U.S.)
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
Series: NISTIR, 6184.
Edition/Format:   Book   Microform : National government publication : Microfiche : EnglishView all editions and formats
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Cecil Leeburn Wilson; C I Watson; Eung Gi Paek; National Institute of Standards and Technology (U.S.)
OCLC Number: 40098669
Notes: Shipping list no.: 98-1024-M.
"July 1998."
Reproduction Notes: Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998]. 1 microfiche : negative.
Description: 23 pages : illustrations.
Series Title: NISTIR, 6184.
Responsibility: C.L. Wilson, C.I. Watson, E.G. Paek.

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