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Effects of plasma, temperature and chemical reactions on porous low dielectric films for semiconductor devices
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Effects of plasma, temperature and chemical reactions on porous low dielectric films for semiconductor devices

Author: Eric Osei-Yiadom; Richard F Reidy
Publisher: [Denton, Tex.] : University of North Texas, 2010.
Dissertation: Thesis (Ph. D.)--University of North Texas, Dec., 2010.
Edition/Format:   Thesis/dissertation : Document : Thesis/dissertation : eBook   Computer File : English
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Material Type: Document, Thesis/dissertation, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Eric Osei-Yiadom; Richard F Reidy
OCLC Number: 726148514
Notes: Title from title page display.
Description: xiv, 171 p. : ill., digital, PDF file.
Details: Mode of access: Internet, via World Wide Web.; System requirements: Adobe Acrobat Reader.
Responsibility: Eric Osei-Yiadom.

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