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Efficient test methodologies for high-speed serial links

Author: Dongwoo Hong; Kwang-Ting Cheng
Publisher: Dordrecht ; London : Springer, 2010.
Series: Lecture notes in electrical engineering, v. 51.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
With the increasing demand for higher data bandwidth, communication systems' data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Hong, Dongwoo.
Efficient test methodologies for high-speed serial links.
Dordrecht ; London : Springer, 2010
(DLC) 2009937220
(OCoLC)436266480
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Dongwoo Hong; Kwang-Ting Cheng
ISBN: 9789048134434 9048134439
OCLC Number: 663094008
Description: 1 online resource (xi, 98 pages) : illustrations.
Contents: An Efficient Jitter Measurement Technique --
BER Estimation for Linear Clock and Data Recovery Circuit --
BER Estimation for Non-linear Clock and Data Recovery Circuit --
Gaps in Timing Margining Test --
An Accurate Jitter Estimation Technique --
A Two-Tone Test Method for Continuous-Time Adaptive Equalizers --
Conclusions.
Series Title: Lecture notes in electrical engineering, v. 51.
Responsibility: by Dongwoo Hong, Kwang-Ting Cheng.
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Abstract:

Covering new and promising techniques for cost-effectively testing high-speed interfaces with high test coverage, the authors focus on efficient test methodologies for jitter and bit-error-rate,  Read more...

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