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Efficient test methodologies for high-speed serial links

Author: Dongwoo Hong; Kwang-Ting Cheng
Publisher: Dordrecht ; London : Springer, 2010.
Series: Lecture notes in electrical engineering, v. 51.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:

Covering new and promising techniques for cost-effectively testing high-speed interfaces with high test coverage, the authors focus on efficient test methodologies for jitter and bit-error-rate,  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
Hong, Dongwoo.
Efficient test methodologies for high-speed serial links.
Dordrecht ; London : Springer, 2010
(DLC) 2009937220
(OCoLC)436266480
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Dongwoo Hong; Kwang-Ting Cheng
ISBN: 9789048134434 9048134439
OCLC Number: 663094008
Description: 1 online resource (xi, 98 pages) : illustrations.
Contents: An Efficient Jitter Measurement Technique --
BER Estimation for Linear Clock and Data Recovery Circuit --
BER Estimation for Non-linear Clock and Data Recovery Circuit --
Gaps in Timing Margining Test --
An Accurate Jitter Estimation Technique --
A Two-Tone Test Method for Continuous-Time Adaptive Equalizers --
Conclusions.
Series Title: Lecture notes in electrical engineering, v. 51.
Responsibility: by Dongwoo Hong, Kwang-Ting Cheng.
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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/663094008> # Efficient test methodologies for high-speed serial links
    a schema:MediaObject, schema:Book, schema:CreativeWork ;
    library:oclcnum "663094008" ;
    library:placeOfPublication <http://dbpedia.org/resource/London> ; # London
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/322470156#Place/dordrecht> ; # Dordrecht
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/ne> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/322470156#Topic/engineering_electrical> ; # Engineering: Electrical
    schema:about <http://experiment.worldcat.org/entity/work/data/322470156#Topic/technology_&_engineering_electronics_circuits_general> ; # TECHNOLOGY & ENGINEERING--Electronics--Circuits--General
    schema:about <http://experiment.worldcat.org/entity/work/data/322470156#Topic/technology_&_engineering_electronics_circuits_integrated> ; # TECHNOLOGY & ENGINEERING--Electronics--Circuits--Integrated
    schema:about <http://experiment.worldcat.org/entity/work/data/322470156#Topic/engineering> ; # Engineering
    schema:about <http://dewey.info/class/621.381548/e22/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/322470156#Topic/ingenierie> ; # Ingénierie
    schema:about <http://id.worldcat.org/fast/1165647> ; # Very high speed integrated circuits--Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/322470156#Topic/very_high_speed_integrated_circuits_testing> ; # Very high speed integrated circuits--Testing
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/53256222> ; # Kwang-Ting Cheng
    schema:creator <http://viaf.org/viaf/106820524> ; # Dongwoo Hong
    schema:datePublished "2010" ;
    schema:description "An Efficient Jitter Measurement Technique -- BER Estimation for Linear Clock and Data Recovery Circuit -- BER Estimation for Non-linear Clock and Data Recovery Circuit -- Gaps in Timing Margining Test -- An Accurate Jitter Estimation Technique -- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers -- Conclusions."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/322470156> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/322470156#Series/lecture_notes_in_electrical_engineering> ; # Lecture notes in electrical engineering ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/436266480> ;
    schema:name "Efficient test methodologies for high-speed serial links"@en ;
    schema:productID "663094008" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/663094008#PublicationEvent/dordrecht_london_springer_2010> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/322470156#Agent/springer> ; # Springer
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=341045> ;
    schema:url <http://swbplus.bsz-bw.de/bsz43084428xcov.htm> ;
    schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=511553> ;
    schema:url <http://dx.doi.org/10.1007/978-90-481-3443-4> ;
    schema:url <http://site.ebrary.com/id/10359863> ;
    schema:url <http://www.springerlink.com/openurl.asp?genre=book&isbn=978-90-481-3443-4> ;
    schema:workExample <http://worldcat.org/isbn/9789048134434> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/663094008> ;
    .


Related Entities

<http://dbpedia.org/resource/London> # London
    a schema:Place ;
    schema:name "London" ;
    .

<http://experiment.worldcat.org/entity/work/data/322470156#Series/lecture_notes_in_electrical_engineering> # Lecture notes in electrical engineering ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/663094008> ; # Efficient test methodologies for high-speed serial links
    schema:name "Lecture notes in electrical engineering ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/322470156#Topic/engineering_electrical> # Engineering: Electrical
    a schema:Intangible ;
    schema:name "Engineering: Electrical"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/322470156#Topic/technology_&_engineering_electronics_circuits_general> # TECHNOLOGY & ENGINEERING--Electronics--Circuits--General
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Electronics--Circuits--General"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/322470156#Topic/technology_&_engineering_electronics_circuits_integrated> # TECHNOLOGY & ENGINEERING--Electronics--Circuits--Integrated
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Electronics--Circuits--Integrated"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/322470156#Topic/very_high_speed_integrated_circuits_testing> # Very high speed integrated circuits--Testing
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85142925> ;
    schema:name "Very high speed integrated circuits--Testing"@en ;
    .

<http://id.worldcat.org/fast/1165647> # Very high speed integrated circuits--Testing
    a schema:Intangible ;
    schema:name "Very high speed integrated circuits--Testing"@en ;
    .

<http://viaf.org/viaf/106820524> # Dongwoo Hong
    a schema:Person ;
    schema:familyName "Hong" ;
    schema:givenName "Dongwoo" ;
    schema:name "Dongwoo Hong" ;
    .

<http://viaf.org/viaf/53256222> # Kwang-Ting Cheng
    a schema:Person ;
    schema:birthDate "1961" ;
    schema:familyName "Cheng" ;
    schema:givenName "Kwang-Ting" ;
    schema:name "Kwang-Ting Cheng" ;
    .

<http://worldcat.org/isbn/9789048134434>
    a schema:ProductModel ;
    schema:isbn "9048134439" ;
    schema:isbn "9789048134434" ;
    .

<http://www.worldcat.org/oclc/436266480>
    a schema:CreativeWork ;
    rdfs:label "Efficient test methodologies for high-speed serial links." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/663094008> ; # Efficient test methodologies for high-speed serial links
    .


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