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Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2002 : San Jose, CA USA, March 12-14, 2002

Author: IEEE Components, Hybrids, and Manufacturing Technology Society.
Publisher: Piscataway, N.J. : IEEE, ©2002.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

This CD-ROM originates from the 18th Symposium on Semiconductor Thermal Measurement and Management, and examines components. It covers topics including: advances in compact models; package and  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Components, Hybrids, and Manufacturing Technology Society.
ISBN: 0780373278 9780780373273 0780373286 9780780373280
OCLC Number: 49340161
Notes: Cover title.
"IEEE Catalog Number 02CH37311 Softbound Edition ; 02CD37311C CD-ROM Edition"--Title page verso.
Description: xii, [198] pages : illustrations ; 28 cm
Contents: Advances in Compact Models; Package & Material Characterization; System Level Analysis; Liquid Cooling Appliacations.
Other Titles: Semiconductor Thermal Measurement and Management Symposium
SEMI-THERM proceedings 2002
Responsibility: [sponsored by IEEE Components, Packaging, and Manufacturing Technology Society].

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