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Eighth International Congress on X-ray Optics and Microanalysis

Author: Donald Robert Beaman; Robert E Ogilvie; David B Wittry; Microbeam Analysis Society.
Publisher: Midland, Mich. : Pendell Pub. Co., 1980.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
International Congress on X-ray Optics and Microanalysis (8th : 1977 : Boston).
Eighth International Congress on X-ray Optics and Microanalysis.
Midland, Mich. : Pendell Pub. Co., 1980
(OCoLC)654425081
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Donald Robert Beaman; Robert E Ogilvie; David B Wittry; Microbeam Analysis Society.
ISBN: 0878121803 9780878121809
OCLC Number: 6924370
Notes: "Papers presented at the Eighth International Congress on X-ray Optics and Microanalysis, held in Boston, Massachusetts, August 18-24, 1977, and sponsored by the Microbeam Analysis Society."
English or French.
Description: xiv, 665 pages : illustrations ; 29 cm
Responsibility: edited by Donald R. Beaman, Robert E. Ogilvie, and David B. Wittry.

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