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Electrical characterization of transition metals in silicon : a study on titanium, cobalt, and nickel and their interaction with hydrogen.

Author: Leopold Scheffler
Publisher: Göttingen : Cuvillier Verlag, 2015.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Scheffler, Leopold.
Electrical characterization of transition metals in silicon:
Göttingen : Cuvillier Verlag, ©2015
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Leopold Scheffler
ISBN: 9783736949881 373694988X
OCLC Number: 1003261633
Description: 1 online resource (125 pages)
Contents: Abstract; Kurzfassung; Contents; Chapter 1 Introduction; Chapter 2 Theory; Chapter 3 Measurement techniques; Chapter 4 Experimental details; Chapter 5 Hydrogenation of metal-free silicon; Chapter 6 Titanium in silicon; Chapter 7 Cobalt in silicon; Chapter 8 Nickel in silicon; Chapter 9 Conclusion; Bibliography; Danksagungen.

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