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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1982 : Orlando, Florida, September 21-23, 1982

Author: IIT Research Institute.; Reliability Analysis Center (U.S.)
Publisher: Griffiss AFB, N.Y. : Reliability Analysis Center, ©1983.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IIT Research Institute.; Reliability Analysis Center (U.S.)
OCLC Number: 9261318
Notes: "EOS-4."
Description: v, 217 pages : illustrations ; 28 cm
Responsibility: sponsored by IIT Research Institute.

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