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Electrical Overstress/Electrostatic Discharge Symposium proceedings

Author: ESD Association.; EOS/ESD Association.; IIT Research Institute.; Reliability Analysis Center (U.S.)
Publisher: Griffiss AFB, NY : Reliability Analysis Center Rome, N.Y. : ESD Association
Edition/Format:   eJournal/eMagazine : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Electronic journals
Conference papers and proceedings
Periodicals
Congresses
Additional Physical Format: Print version:
Electrical Overstress/Electrostatic Discharge Symposium.
Electrical Overstress/Electrostatic Discharge Symposium proceedings
(DLC) 86649737
(OCoLC)7366665
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File, Journal / Magazine / Newspaper
All Authors / Contributors: ESD Association.; EOS/ESD Association.; IIT Research Institute.; Reliability Analysis Center (U.S.)
ISSN:2164-9340
OCLC Number: 232114000
Other Titles: Electrical Overstress/Electrostatic Discharge Symposium proceedings
ESD/EOS symposium proceedings
Responsibility: sponsored by IIT Research Institute.

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