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Electron backscatter diffraction in materials science

Author: Adam J Schwartz; Mukul Kumar; B L Adams
Publisher: New York : Kluwer Academic, ©2000.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

The purpose of this text is to provide the fundamental basis for the automated indexing of electron backscatter diffraction (EBSD) patterns as a means of obtaining crystallographic texture data. The  Read more...

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Document Type: Book
All Authors / Contributors: Adam J Schwartz; Mukul Kumar; B L Adams
ISBN: 030646487X 9780306464874
OCLC Number: 44619481
Description: xvi, 339 pages : illustrations ; 26 cm
Contents: 1. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy / David J. Dingley --
2. Theoretical Framework for Electron Backscatter Diffraction / Valerie Randle --
3. Representations of Texture in Orientation Space / Krishna Rajan --
4. Rodrigues-Frank Representations of Crystallographic Texture / Krishna Rajan --
5. Fundamentals of Automated EBSD / Stuart I. Wright --
6. Studies on the Accuracy of Electron Backscatter Diffraction Measurements / Melik C. Demirel, Bassem S. El-Dasher and Brent L. Adams / [and others] --
7. Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope / Joseph R. Michael --
8. Three-Dimensional Orientation Imaging / Dorte Juul Jensen.
Responsibility: edited by Adam J. Schwartz, Mukul Kumar, and Brent L. Adams.

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