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Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000

Author: Krsto Prelec
Publisher: Melville, N.Y. : American Institute of Physics, 2001.
Series: AIP conference proceedings, no. 572.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (DLC) 2001091142
(OCoLC)47927783
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Krsto Prelec
ISBN: 0735400113 9780735400115
OCLC Number: 71225202
Description: xiv, 304 pages : illustrations ; 25 cm.
Series Title: AIP conference proceedings, no. 572.
Responsibility: editor, Krsto Prelec.

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