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Electron energy-loss spectroscopy in the electron microscope

Author: R F Egerton
Publisher: New York : Plenum Press, ©1996.
Series: Language of science.
Edition/Format:   Print book : English : 2nd edView all editions and formats
Database:WorldCat
Summary:

Explores several applications of EELS developed over the years. This work includes chapters that explore progress in parallel-recording detectors and image-filtering systems as well as spectral fine  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: R F Egerton
ISBN: 0306452235 9780306452239
OCLC Number: 34409627
Description: xi, 485 pages : illustrations ; 24 cm.
Contents: An Introduction to Electron Energyloss Spectroscopy. Instrumentation for Energyloss Spectroscopy. Electron Scattering Theory. Quantitative Analysis of the Energyloss Spectrum. Applications of Electron Energyloss Spectroscopy. Appendix A: Relativistic Bethe Theory. Appendix B: Computer Programs. Appendix C: Plasmon Energies of Some Elements and Compounds. Appendix D: Innershell Energies and Edge Shapes. Appendix E: Electron Wavelengths and Relativistic Factor: Fundamental Constants. Index.
Series Title: Language of science.
Responsibility: R.F. Egerton.
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Reviews of the Second Edition: 'The text...contains a wealth of practical detail and experimental insight...This book is an essential purchase for any microscopist who is using, or planning to use, Read more...

 
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