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Electron microscopy 1990 : proceedings of the XIIth International Congress on Electron Microscopy, held in Seattle, Washington, USA, 12-18 August 1990

Author: L D Peachey; D B Williams; Electron Microscopy Society of America.; Microbeam Analysis Society.
Publisher: San Francisco : San Francisco Press, ©1990.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: L D Peachey; D B Williams; Electron Microscopy Society of America.; Microbeam Analysis Society.
OCLC Number: 23002645
Notes: 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society.
Description: 4 volumes : illustrations ; 26 cm
Contents: v. 1. Imaging sciences.--v. 2. Analytical sciences .--v. 3. Biological sciences.--v. 4. Materials sciences.
Responsibility: editors, L.D. Peachey, D.B. Williams.

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