zum Inhalt wechseln
Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997 Titelvorschau
SchließenTitelvorschau
Prüfung…

Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997

Verfasser/in: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Verlag: Bristol ; Philadelphia : Institute of Physics Pub., 1997.
Serien: Institute of Physics conference series, no. 153.
Ausgabe/Format   Print book : Tagungsband : EnglischAlle Ausgaben und Formate anzeigen
Datenbank:WorldCat
Zusammenfassung:

Includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of  Weiterlesen…

Bewertung:

(noch nicht bewertet) 0 mit Rezensionen - Verfassen Sie als Erste eine Rezension.

Themen
Ähnliche Titel

 

Exemplar ausleihen

&AllPage.SpinnerRetrieving; Suche nach Bibliotheken, die diesen Titel besitzen ...

Details

Gattung/Form: Conference papers and proceedings
Cambridge (1997)
Congresses
Medientyp: Tagungsband
Dokumenttyp: Buch
Alle Autoren: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750304413 9780750304412
OCLC-Nummer: 37947398
Beschreibung: xviii, 687 pages : illustrations ; 24 cm.
Inhalt: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
Serientitel: Institute of Physics conference series, no. 153.
Verfasserangabe: edited by J.M. Rodenburg.
Weitere Informationen:

Rezensionen

Redaktionelle Rezension

Nielsen BookData

Abstracted in INSPEC Database. ted in INSPEC Database.

 
Nutzer-Rezensionen
Suche nach GoodReads-Rezensionen
Suche nach DOGObooks-Rezensionen…

Tags

Tragen Sie als Erste Tags ein.
Anfrage bestätigen

Sie haben diesen Titel bereits angefordert. Wenn Sie trotzdem fortfahren möchten, klicken Sie auf OK.

Verlinkung


Primary Entity

<http://www.worldcat.org/oclc/37947398> # Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "37947398" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/837023034#Place/philadelphia> ; # Philadelphia
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/837023034#Place/bristol> ; # Bristol
    schema:about <http://dewey.info/class/502.825/e21/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/electron_microscopy> ; # Electron microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Thing/electron_microscopy> ; # Electron microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron> ; # Microscopy, Electron
    schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/elektronenmikroskopie> ; # Elektronenmikroskopie
    schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/kongress> ; # Kongreß
    schema:about <http://dewey.info/class/620.11299/e21/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron_history> ; # Microscopy, Electron--History
    schema:about <http://id.worldcat.org/fast/906682> ; # Electron microscopy
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://experiment.worldcat.org/entity/work/data/837023034#Person/rodenburg_j_m_john_m> ; # John M. Rodenburg
    schema:contributor <http://viaf.org/viaf/127675769> ; # Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
    schema:datePublished "1997" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/837023034> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:genre "Cambridge (1997)"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/837023034#Series/institute_of_physics_conference_series> ; # Institute of Physics conference series ;
    schema:name "Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997"@en ;
    schema:productID "37947398" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/37947398#PublicationEvent/bristol_philadelphia_institute_of_physics_pub_1997> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/837023034#Agent/institute_of_physics_pub> ; # Institute of Physics Pub.
    schema:workExample <http://worldcat.org/isbn/9780750304412> ;
    umbel:isLike <http://bnb.data.bl.uk/id/resource/GB9836038> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/37947398> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/837023034#Agent/institute_of_physics_pub> # Institute of Physics Pub.
    a bgn:Agent ;
    schema:name "Institute of Physics Pub." ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Person/rodenburg_j_m_john_m> # John M. Rodenburg
    a schema:Person ;
    schema:familyName "Rodenburg" ;
    schema:givenName "John M." ;
    schema:givenName "J. M." ;
    schema:name "John M. Rodenburg" ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Series/institute_of_physics_conference_series> # Institute of Physics conference series ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/37947398> ; # Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997
    schema:name "Institute of Physics conference series ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Thing/electron_microscopy> # Electron microscopy
    a schema:Thing ;
    schema:name "Electron microscopy" ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Topic/elektronenmikroskopie> # Elektronenmikroskopie
    a schema:Intangible ;
    schema:name "Elektronenmikroskopie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron> # Microscopy, Electron
    a schema:Intangible ;
    schema:name "Microscopy, Electron"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron_history> # Microscopy, Electron--History
    a schema:Intangible ;
    schema:name "Microscopy, Electron--History"@en ;
    .

<http://id.worldcat.org/fast/906682> # Electron microscopy
    a schema:Intangible ;
    schema:name "Electron microscopy"@en ;
    .

<http://viaf.org/viaf/127675769> # Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
    a schema:Organization ;
    schema:name "Institute of Physics (Great Britain). Electron Microscopy and Analysis Group." ;
    .

<http://worldcat.org/isbn/9780750304412>
    a schema:ProductModel ;
    schema:isbn "0750304413" ;
    schema:isbn "9780750304412" ;
    .

<http://www.worldcat.org/title/-/oclc/37947398>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/37947398> ; # Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997
    schema:dateModified "2015-08-01" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Fenster schließen

Bitte in WorldCat einloggen 

Sie haben kein Konto? Sie können sehr einfach ein kostenloses Konto anlegen,.