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Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997

Auteur : J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Éditeur: Bristol ; Philadelphia : Institute of Physics Pub., 1997.
Collection: Institute of Physics conference series, no. 153.
Édition/format:   Livre imprimé : Publication de conférence : AnglaisVoir toutes les éditions et tous les formats
Base de données:WorldCat
Résumé:

Includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of  Lire la suite...

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Détails

Genre/forme: Congresses
Conference papers and proceedings
Cambridge (1997)
Type d’ouvrage: Publication de conférence
Type de document: Livre
Tous les auteurs / collaborateurs: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750304413 9780750304412
Numéro OCLC: 37947398
Description: xviii, 687 pages : illustrations ; 24 cm.
Contenu: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
Titre de collection: Institute of Physics conference series, no. 153.
Responsabilité: edited by J.M. Rodenburg.
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