passa ai contenuti
Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997 Anteprima di questo documento
ChiudiAnteprima di questo documento
Stiamo controllando…

Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997

Autore: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Editore: Bristol ; Philadelphia : Institute of Physics Pub., 1997.
Serie: Institute of Physics conference series, no. 153.
Edizione/Formato:   Libro : Conference publication : EnglishVedi tutte le edizioni e i formati
Banca dati:WorldCat
Sommario:

Includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of  Per saperne di più…

Voto:

(non ancora votato) 0 con commenti - Diventa il primo.

Soggetti
Altri come questo

 

Trova una copia in biblioteca

&AllPage.SpinnerRetrieving; Stiamo ricercando le biblioteche che possiedono questo documento…

Dettagli

Genere/forma: Cambridge (1997)
Conference proceedings
Congresses
Tipo materiale: Conference publication
Tipo documento: Book
Tutti gli autori / Collaboratori: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750304413 9780750304412
Numero OCLC: 37947398
Descrizione: xviii, 687 p. : ill. ; 24 cm.
Contenuti: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
Titolo della serie: Institute of Physics conference series, no. 153.
Responsabilità: edited by J.M. Rodenburg.
Maggiori informazioni:

Commenti

Recensioni editoriali

Sinossi editore

Abstracted in INSPEC Database. ted in INSPEC Database.

 
Commenti degli utenti
Recuperando commenti GoodReads…
Stiamo recuperando commenti DOGObooks

Etichette

Diventa il primo.
Conferma questa richiesta

Potresti aver già richiesto questo documento. Seleziona OK se si vuole procedere comunque con questa richiesta.

Dati collegati


<http://www.worldcat.org/oclc/37947398>
library:oclcnum"37947398"
library:placeOfPublication
library:placeOfPublication
library:placeOfPublication
owl:sameAs<info:oclcnum/37947398>
rdf:typeschema:Book
schema:about
schema:about
schema:about
schema:about
schema:about
schema:about
schema:about
schema:about
schema:contributor
schema:contributor
<http://viaf.org/viaf/144825100>
rdf:typeschema:Organization
schema:name"Institute of Physics (Great Britain). Electron Microscopy and Analysis Group."
schema:datePublished"1997"
schema:exampleOfWork<http://worldcat.org/entity/work/id/837023034>
schema:genre"Conference proceedings."@en
schema:genre"Conference proceedings"@en
schema:genre"Cambridge (1997)"@en
schema:inLanguage"en"
schema:name"Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997"@en
schema:numberOfPages"687"
schema:publisher
schema:url
schema:workExample
umbel:isLike<http://bnb.data.bl.uk/id/resource/GB9836038>

Content-negotiable representations

Chiudi finestra

Per favore entra in WorldCat 

Non hai un account? Puoi facilmente crearne uno gratuito.