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Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997

Autore: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Editore: Bristol ; Philadelphia : Institute of Physics Pub., 1997.
Serie: Institute of Physics conference series, no. 153.
Edizione/Formato:   book_printbook : Conference publication : EnglishVedi tutte le edizioni e i formati
Banca dati:WorldCat
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Includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of  Per saperne di più…

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Genere/forma: Congresses
Conference papers and proceedings
Cambridge (1997)
Tipo materiale: Conference publication
Tipo documento: Book
Tutti gli autori / Collaboratori: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750304413 9780750304412
Numero OCLC: 37947398
Descrizione: xviii, 687 pages : illustrations ; 24 cm.
Contenuti: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
Titolo della serie: Institute of Physics conference series, no. 153.
Responsabilità: edited by J.M. Rodenburg.
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