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Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997 資料のプレビュー
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Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997

著者: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
出版: Bristol ; Philadelphia : Institute of Physics Pub., 1997.
シリーズ: Institute of Physics conference series, no. 153.
エディション/フォーマット:   book_printbook : Conference publication : Englishすべてのエディションとフォーマットを見る
データベース:WorldCat
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Includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of  続きを読む

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ジャンル/形式: Congresses
Conference papers and proceedings
Cambridge (1997)
資料の種類: Conference publication
ドキュメントの種類: 図書
すべての著者/寄与者: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750304413 9780750304412
OCLC No.: 37947398
物理形態: xviii, 687 pages : illustrations ; 24 cm.
コンテンツ: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
シリーズタイトル: Institute of Physics conference series, no. 153.
責任者: edited by J.M. Rodenburg.
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