doorgaan naar inhoud
Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997 Voorbeeldweergave van dit item
SluitenVoorbeeldweergave van dit item
Bezig met controle...

Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997

Auteur: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Uitgever: Bristol ; Philadelphia : Institute of Physics Pub., 1997.
Serie: Institute of Physics conference series, no. 153.
Editie/Formaat:   Print book : Conferentie-uitgave : EngelsAlle edities en materiaalsoorten bekijken.
Database:WorldCat
Samenvatting:

Includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of  Meer lezen...

Beoordeling:

(nog niet beoordeeld) 0 met beoordelingen - U bent de eerste

Onderwerpen
Meer in deze trant

 

Zoeken naar een in de bibliotheek beschikbaar exemplaar

&AllPage.SpinnerRetrieving; Bibliotheken met dit item worden gezocht…

Details

Genre/Vorm: Congresses
Conference papers and proceedings
Cambridge (1997)
Genre: Conferentie-uitgave
Soort document: Boek
Alle auteurs / medewerkers: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750304413 9780750304412
OCLC-nummer: 37947398
Beschrijving: xviii, 687 pages : illustrations ; 24 cm.
Inhoud: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
Serietitel: Institute of Physics conference series, no. 153.
Verantwoordelijkheid: edited by J.M. Rodenburg.
Meer informatie:

Beoordelingen

Professionele beoordelingen

Synopsis uitgever

Abstracted in INSPEC Database. ted in INSPEC Database.

 
Beoordelingen door gebruikers
Beoordelingen van GoodReads worden opgehaald...
Bezig met opvragen DOGObooks-reviews...

Tags

U bent de eerste.
Bevestig deze aanvraag

Misschien heeft u dit item reeds aangevraagd. Selecteer a.u.b. Ok als u toch wilt doorgaan met deze aanvraag.

Gekoppelde data


Primary Entity

<http://www.worldcat.org/oclc/37947398> # Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "37947398" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/837023034#Place/philadelphia> ; # Philadelphia
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/837023034#Place/bristol> ; # Bristol
   schema:about <http://dewey.info/class/502.825/e21/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/electron_microscopy> ; # Electron microscopy
   schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Thing/electron_microscopy> ; # Electron microscopy
   schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron> ; # Microscopy, Electron
   schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/elektronenmikroskopie> ; # Elektronenmikroskopie
   schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/kongress> ; # Kongreß
   schema:about <http://dewey.info/class/620.11299/e21/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron_history> ; # Microscopy, Electron--history
   schema:about <http://id.worldcat.org/fast/906682> ; # Electron microscopy
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/68221910> ; # John M. Rodenburg
   schema:contributor <http://viaf.org/viaf/144825100> ; # Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
   schema:datePublished "1997" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/837023034> ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:genre "Congresses"@en ;
   schema:genre "Conference publication"@en ;
   schema:genre "Cambridge (1997)"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/837023034#Series/institute_of_physics_conference_series> ; # Institute of Physics conference series ;
   schema:name "Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997"@en ;
   schema:productID "37947398" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/37947398#PublicationEvent/bristol_philadelphia_institute_of_physics_pub_1997> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/837023034#Agent/institute_of_physics_pub> ; # Institute of Physics Pub.
   schema:workExample <http://worldcat.org/isbn/9780750304412> ;
   umbel:isLike <http://bnb.data.bl.uk/id/resource/GB9836038> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/37947398> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/837023034#Agent/institute_of_physics_pub> # Institute of Physics Pub.
    a bgn:Agent ;
   schema:name "Institute of Physics Pub." ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Series/institute_of_physics_conference_series> # Institute of Physics conference series ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/37947398> ; # Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997
   schema:name "Institute of Physics conference series ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Thing/electron_microscopy> # Electron microscopy
    a schema:Thing ;
   schema:name "Electron microscopy" ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Topic/elektronenmikroskopie> # Elektronenmikroskopie
    a schema:Intangible ;
   schema:name "Elektronenmikroskopie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron> # Microscopy, Electron
    a schema:Intangible ;
   schema:name "Microscopy, Electron"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/837023034#Topic/microscopy_electron_history> # Microscopy, Electron--history
    a schema:Intangible ;
   schema:name "Microscopy, Electron--history"@en ;
    .

<http://id.worldcat.org/fast/906682> # Electron microscopy
    a schema:Intangible ;
   schema:name "Electron microscopy"@en ;
    .

<http://viaf.org/viaf/144825100> # Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
    a schema:Organization ;
   schema:name "Institute of Physics (Great Britain). Electron Microscopy and Analysis Group." ;
    .

<http://viaf.org/viaf/68221910> # John M. Rodenburg
    a schema:Person ;
   schema:familyName "Rodenburg" ;
   schema:givenName "John M." ;
   schema:givenName "J. M." ;
   schema:name "John M. Rodenburg" ;
    .

<http://worldcat.org/isbn/9780750304412>
    a schema:ProductModel ;
   schema:isbn "0750304413" ;
   schema:isbn "9780750304412" ;
    .

<http://www.worldcat.org/title/-/oclc/37947398>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/37947398> ; # Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997
   schema:dateModified "2017-04-02" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Venster sluiten

Meld u aan bij WorldCat 

Heeft u geen account? U kunt eenvoudig een nieuwe gratis account aanmaken.