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Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997

Autor: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Editora: Bristol ; Philadelphia : Institute of Physics Pub., 1997.
Séries: Institute of Physics conference series, no. 153.
Edição/Formato   Print book : Publicação de conferência : InglêsVer todas as edições e formatos
Base de Dados:WorldCat
Resumo:

Includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of  Ler mais...

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Detalhes

Gênero/Forma: Congresses
Conference papers and proceedings
Cambridge (1997)
Tipo de Material: Publicação de conferência
Tipo de Documento: Livro
Todos os Autores / Contribuintes: J M Rodenburg; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750304413 9780750304412
Número OCLC: 37947398
Descrição: xviii, 687 pages : illustrations ; 24 cm.
Conteúdos: Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index.
Título da Série: Institute of Physics conference series, no. 153.
Responsabilidade: edited by J.M. Rodenburg.
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