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Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999

Author: C J Kiely; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Publisher: Bristol ; Philadelphia : Institute of Physics Pub., ©1999.
Series: Institute of Physics conference series, no. 161.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

Offers an overview of developments and outlines opportunities for future research in electron microscopy. This book presents the applications of these techniques in materials science, metallurgy, and  Read more...

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Genre/Form: Conference papers and proceedings
Sheffield (1999)
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: C J Kiely; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0750305770 9780750305778
OCLC Number: 42888129
Description: xvii, 632 pages : illustrations ; 24 cm.
Contents: Section 1 Plenary lectures: interface science - knowing more about less, M. Ruhle et al; the refinement of oxide structures, D.A. Jefferson. (Part contents) Section 2 Interfaces and surfaces: three-dimensional atomic scale analysis of interfaces, A. Cerezo et al; composition of grain boundaries and interfaces - a comparison of modern analytical techniques using a 300 kV FEGTEM, V.J. Keast. (Part contents) Section 3 Scanning electron microscopy: simplified aberration corrector for low-voltage SEM, S.A.M. Mentink et al; temperature and energy dependence of SEM dopant contrast, S.L. Elliot et al; probing nitride thin films in 3 dimensions using a variable energy electron beam, C. Trager-Cowan et al. (Part contents) Section 4 Electron crystallography: energy production in biological systems probed by electron crystallography, P.A. Bullough et al; results of a pilot experiment on direct phase determination of diffracted beams in TEM, B.M. Mertens, P. Kruit. (Part contents) Section 5 Analytical electron microscopy: quantitative compositional imaging with energy-filtering TEM, F. Hofer et al; application of multivariate statistical analysis to complex grain boundary microstructure, E.J.A. Chevalier, G.A. Bottom. (Part contents) Section 6 High resolution electron microscopy: HRTEM and nano-analytical study of metastable precipitates in aluminium alloy 6061, T. Epicier et al; comprehensive characterization of a FEGTEM, A.I. Kirkland et al. (Part contents) Section 7 Advanced scanning probe techniques: magnetic force microscopy of soft magnetic films, G.P. Heydon et al; electrons and photons - exploiting the connection, A. Howie. (Part contents) Section 8 Ceramics/carbon/composites: electron microscopy of real ceramics, W.E. Lee et al; influence of additives on microstructural evolution of MgO-C refractories, S. Zhang et al; comparative study of properties of DLC films by electron energy loss spectroscopy and X-ray reflectivity, V. Stolojan et al. (Part contents) Section 9 Metals/intermetallics: microstructural characterization by high resolution electron backscattered diffraction in the FEGSEM - competition for the TEM? F.J. Humphreys; microanalysis of precipitates in Ti-A1 alloy, J.G. Zheng. (Part contents) Section 10 Catalysts/sensors/environmental materials: thin film structures formed from metallic nanoparticles - manipulation of the self-assembly process, C.J. Kiely et al; investigation of redox-cycled Ce-Zr mixed oxides for automotive catalysts by electron microscopy, R.T. Baker et al. (Part contents) Section 11 Semiconductor/superconductors: the role of TEM in semiconductor device development and manufacture, R. Beanland; cathodoluminescence studies in InGaN/GaN layers in the scanning electron microscope, A. Bewick et al. (Part contents).
Series Title: Institute of Physics conference series, no. 161.
Responsibility: edited by C.J. Kiely.
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