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Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999

Author: C J Kiely; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Publisher: Bristol ; Philadelphia : Institute of Physics Pub., ©1999.
Series: Institute of Physics conference series, no. 161.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Electronic books
Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Electron microscopy and analysis 1999.
Bristol ; Philadelphia : Institute of Physics Pub., ©1999
(DLC) 99058788
(OCoLC)42888129
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: C J Kiely; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
ISBN: 0585347042 9780585347042
OCLC Number: 47008872
Description: 1 online resource (xvii, 632 pages) : illustrations.
Contents: Section 1 Plenary lectures --
Section 2 Interfaces and surfaces --
Section 3 Scanning electron microscopy --
Section 4 Electron crystallography --
Section 5 Analytical electron microscopy --
Section 6 High resolution electron microscopy --
Section 7 Advanced scanning probe techniques --
Section 8 Ceramics/carbon/composites --
Section 9 Metals/intermetallics --
Section 10 Catalysts/sensors/environmental materials --
Section 11 Semiconductors/superconductors.
Series Title: Institute of Physics conference series, no. 161.
Responsibility: edited by C.J. Kiely.

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