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Electron microscopy : principles and fundamentals

Author: S Amelinckx
Publisher: Weinheim : VCH, ©1997.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:. * Stationary Beam  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Electron microscopy.
Weinheim : VCH, ©1997
(OCoLC)38935366
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: S Amelinckx
ISBN: 9783527614554 3527614559
OCLC Number: 291098261
Reproduction Notes: Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL
Description: 1 online resource (xii, 515 pages) : illustrations (some color)
Details: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Contents: Electron Microscopy Principles and Fundamentals; Contents; Introduction; 1 Stationary Beam Methods; 2 Scanning Beam Methods; Index.
Responsibility: edited by S. Amelinckx [and others].

Abstract:

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:. * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods. * S.

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Primary Entity

<http://www.worldcat.org/oclc/291098261> # Electron microscopy : principles and fundamentals
    a schema:CreativeWork, schema:MediaObject, schema:Book ;
   library:oclcnum "291098261" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/802838788#Place/weinheim> ; # Weinheim
   schema:about <http://id.worldcat.org/fast/906682> ; # Electron microscopy
   schema:about <http://dewey.info/class/502.825/e22/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/802838788#Topic/science_electron_microscopes_&_microscopy> ; # SCIENCE--Electron Microscopes & Microscopy
   schema:about <http://experiment.worldcat.org/entity/work/data/802838788#Topic/elektronenmicroscopie> ; # Elektronenmicroscopie
   schema:about <http://experiment.worldcat.org/entity/work/data/802838788#Topic/elektronenmikroskopie> ; # Elektronenmikroskopie
   schema:bookFormat schema:EBook ;
   schema:contributor <http://viaf.org/viaf/68990428> ; # Severin Amelinckx
   schema:copyrightYear "1997" ;
   schema:datePublished "1997" ;
   schema:description "Electron Microscopy Principles and Fundamentals; Contents; Introduction; 1 Stationary Beam Methods; 2 Scanning Beam Methods; Index."@en ;
   schema:description "Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:. * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods. * S."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/802838788> ;
   schema:genre "Electronic books"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/38935366> ;
   schema:name "Electron microscopy : principles and fundamentals"@en ;
   schema:productID "291098261" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/291098261#PublicationEvent/weinheim_vch_1997> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/802838788#Agent/vch> ; # VCH
   schema:url <http://catalog.hathitrust.org/api/volumes/oclc/38935366.html> ;
   schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=481519> ;
   schema:url <http://site.ebrary.com/id/10518659> ;
   schema:url <http://www.123library.org/book_details/?id=29290> ;
   schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=246672> ;
   schema:url <http://www.myilibrary.com?id=184255> ;
   schema:url <http://onlinelibrary.wiley.com/book/10.1002/9783527614561> ;
   schema:workExample <http://worldcat.org/isbn/9783527614554> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/291098261> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/802838788#Topic/elektronenmicroscopie> # Elektronenmicroscopie
    a schema:Intangible ;
   schema:name "Elektronenmicroscopie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/802838788#Topic/elektronenmikroskopie> # Elektronenmikroskopie
    a schema:Intangible ;
   schema:name "Elektronenmikroskopie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/802838788#Topic/science_electron_microscopes_&_microscopy> # SCIENCE--Electron Microscopes & Microscopy
    a schema:Intangible ;
   schema:name "SCIENCE--Electron Microscopes & Microscopy"@en ;
    .

<http://id.worldcat.org/fast/906682> # Electron microscopy
    a schema:Intangible ;
   schema:name "Electron microscopy"@en ;
    .

<http://viaf.org/viaf/68990428> # Severin Amelinckx
    a schema:Person ;
   schema:familyName "Amelinckx" ;
   schema:givenName "Severin" ;
   schema:givenName "S." ;
   schema:name "Severin Amelinckx" ;
    .

<http://worldcat.org/isbn/9783527614554>
    a schema:ProductModel ;
   schema:isbn "3527614559" ;
   schema:isbn "9783527614554" ;
    .

<http://www.worldcat.org/oclc/38935366>
    a schema:CreativeWork ;
   rdfs:label "Electron microscopy." ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/291098261> ; # Electron microscopy : principles and fundamentals
    .


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