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Elements of X-ray diffraction

Author: Bernard Dennis Cullity; Stuart R Stock
Publisher: Upper Saddle River, NJ : Pearson/Prentice Hall, 2001.
Edition/Format:   Print book : English : 3. ed., internat. edView all editions and formats
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Document Type: Book
All Authors / Contributors: Bernard Dennis Cullity; Stuart R Stock
ISBN: 0131788183 9780131788183 0201610914 9780201610918 0201554054 9780201554052
OCLC Number: 248041908
Notes: Previous edition: Reading, Mass.: Addison-Wesley, 1978.
Description: XXVIII, 664 Seiten : Illustrationen, Diagramme ; 25 cm
Contents: 1. Properties of X-rays. 2. Geometry of Crystals. 3. Diffraction I: Directions of Diffracted Beams. 4. Diffraction II: Intensities of Diffracted Beams. 5. Diffraction III: Non-Ideal Samples. 6. Laure Photographs. 7. Powder Photographs. 8. Diffractometer and Spectrometer. 9. Orientation and Quality of Single Crystals. 10. Structure of Polycrystalline Aggregates. 11. Determination of Crystal Structure. 12. Precise Parameter Measurements. 13. Phase-Diagram Determination. 14. Order-Disorder Transformation. 15. Chemical Analysis of X-ray Diffraction. 16. Chemical Analysis by X-ray Spectrometry. 17. Measurements of Residual Stress. 18. Polymers. 19. Small Angle Scatters. 20. Transmission Electron Microscope.
Responsibility: B.D. Cullity ; S.R. Stock.

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