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ESD : failure mechanisms and models

Author: Steven H Voldman; Wiley InterScience (Online service)
Publisher: Chichester, West Sussex, U.K. ; Hoboken, N.J. : J. Wiley, 2009.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:

Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
Voldman, Steven H.
ESD.
Chichester, West Sussex, U.K. ; Hoboken, N.J. : J. Wiley, 2009
(DLC) 2009015206
(OCoLC)316009726
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Steven H Voldman; Wiley InterScience (Online service)
ISBN: 9780470747254 0470747250 9780470747261 0470747269 0470511370 9780470511374
OCLC Number: 441888589
Description: 1 online resource (xxiv, 384 p.) : ill.
Contents: Failure analysis and ESD --
Failure analysis tools, models, and physics of failure --
CMOS failure mechanisms --
CMOS circuits : receivers and off-chip drivers --
CMOS integration --
SOI ESD failure mechanisms --
RF CMOS and ESD --
Micro-electromechanical systems --
Gallium arsenide --
Smart power, LDMOS and BCD technology --
Magnetic recording --
Photo-masks and reticles : failure mechanisms.
Other Titles: Electrostatic discharge
Responsibility: Steven H. Voldman.

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