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ESD : Failure Mechanisms and Models.

Author: Dr Steven H Voldman
Publisher: Chichester : John Wiley & Sons, 2009.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific  Read more...
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Genre/Form: Electronic books
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Dr Steven H Voldman
ISBN: 9780470747261 0470747269
OCLC Number: 609844472
Description: 1 online resource (410 pages)
Contents: ESD Failure Mechanisms and Models; Contents; About the Author; Preface; Acknowledgments; 1 Failure Analysis and ESD; 2 Failure Analysis Tools, Models, and Physics of Failure; 3 CMOS Failure Mechanisms; 4 CMOS Circuits: Receivers and Off-Chip Drivers; 5 CMOS Integration; 6 SOI ESD Failure Mechanisms; 7 RF CMOS and ESD; 8 Micro-electromechanical Systems; 9 Gallium Arsenide; 10 Smart Power, LDMOS, and BCD Technology; 11 Magnetic Recording; 12 Photo-masks and Reticles: Failure Mechanisms; Index.

Abstract:

Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodol.

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