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ESD in silicon integrated circuits

Author: E A Amerasekera; Charvaka Duvvury
Publisher: Chichester ; New York : J. Wiley, ©1995.
Series: Design and measurement in electronic engineering.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

This study explains the practical aspects of electrostatic discharge (ESD) and its implications in the design and development of new technologies and integrated circuits. All aspects of ESD are  Read more...

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Additional Physical Format: Online version:
Amerasekera, E.A.
ESD in silicon integrated circuits.
Chichester ; New York : J. Wiley, ©1995
(OCoLC)607810111
Online version:
Amerasekera, E.A.
ESD in silicon integrated circuits.
Chichester ; New York : J. Wiley, ©1995
(OCoLC)624433764
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: E A Amerasekera; Charvaka Duvvury
ISBN: 0471954810 9780471954811
OCLC Number: 32133336
Description: xiv, 209 pages : illustrations ; 25 cm.
Contents: 1. Introduction --
2. ESD Phenomena and Test Methods --
3. Physics and Operation of ESD Protection Circuit Elements --
4. Design and Layout Requirements --
5. Failure Modes, Reliability Issues and Case Studies --
6. Modeling and Characterization --
7. Influence of Processing on ESD --
8. Conclusions.
Series Title: Design and measurement in electronic engineering.
Other Titles: Electrostatic Discharge in silicon integrated circuits
Responsibility: Ajith Amerasekera, Charvaka Duvvury.
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