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EUV, x-ray, and gamma-ray instrumentation for astronomy II : 24-26 July 1991, San Diego, California

Author: Oswald H W Siegmund; Richard E Rothschild; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 1991.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 1549.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Oswald H W Siegmund; Richard E Rothschild; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819406775 9780819406774
OCLC Number: 24949307
Notes: "Part of a five-conference program on X-Ray and EUV Technologies, held at SPIE's 1991 International Symposium on Optical Applied Science and Engineering, 21-26 July 1991, in San Diego, California"--Page ix.
Description: ix, 440 pages : illustrations ; 28 cm.
Contents: Proportional counter detectors --
Microchannel-plate detectors --
X-ray and gamma-ray spectroscopy and imaging techniques --
Spaceborne experiments and missions --
Solid state and cryogenic detectors.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 1549.
Other Titles: X-ray and EUV technologies.
EUV, x-ray, and gamma-ray instrumentation for astronomy 2
Responsibility: Oswald H. Siegmund, Richard E. Rothschild, Chairs.

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Primary Entity

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