skip to content
Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns Preview this item
ClosePreview this item
Checking...

Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns

Author: Gary L Katulka; U.S. Army Research Laboratory.
Publisher: [Aberdeen Proving Ground, MD] : Army Research Laboratory, [1999]
Series: ARL-TR (Aberdeen Proving Ground, Md.), 1937.
Edition/Format:   eBook : Document : National government publication : EnglishView all editions and formats
Summary:
The experiments described demonstrate the electrical behavior of SiC and metal ohmic-contact layers as a function of thermal stress. It has been determined from these experiments that both titanium (Ti) and tantalum (Ta) metalization structures will provide a stable electrical ohmic-contact with n-type SiC after exposure to elevated temperatures for short bursts of time that are considered relevant for  Read more...
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Additional Physical Format: Print version:
Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns
(OCoLC)45209605
Material Type: Document, Government publication, National government publication, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Gary L Katulka; U.S. Army Research Laboratory.
OCLC Number: 227891956
Notes: Title from title screen (viewed on Apr. 27, 2012).
"April 1999."
Description: 1 online resource (viii, 20 pages) : illustrations.
Series Title: ARL-TR (Aberdeen Proving Ground, Md.), 1937.
Responsibility: by Gary L. Katulka.

Abstract:

The experiments described demonstrate the electrical behavior of SiC and metal ohmic-contact layers as a function of thermal stress. It has been determined from these experiments that both titanium (Ti) and tantalum (Ta) metalization structures will provide a stable electrical ohmic-contact with n-type SiC after exposure to elevated temperatures for short bursts of time that are considered relevant for pulsed-powered electric weapon technologies. The Ti-SiC structure investigated exhibited a stable current-voltage (I-V) characteristic to as much as 800 deg C for a 10-min burst, while Ta metalizations provided a stable I-V characteristic on SiC even after a temperature burst of 1,000 deg C for as long as a 3-min interval. For samples of n-type, 4H SiC, metalized with (Ti), the standard deviation in resistance (resistivity) of the measured samples is less than 0.17 ohms for a sample having an average resistance of 4.45 ohms. For the Ta contact on SiC, the standard deviation in resistance is 0.05 ohms for a sample having an average resistance of 4.25 ohms. The experiments showed that for both Ti and Ta metalized SiC samples, the change in resistivity of annealed samples is between 3.8% and 1.2% compared to the average values of sample resistance based upon the I-V measurement technique used. These results indicate the ability of Ti-SiC and Ta-SiC structures to perform in a stable manner without significant electrical degradation to the metal contact, SiC substrate, or the metal-semiconductor interface as a function of high-temperature burst conditions.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/227891956> # Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
   library:oclcnum "227891956" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/4160999182#Place/aberdeen_proving_ground_md> ; # Aberdeen Proving Ground, MD
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mdu> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/titanium> ; # Titanium
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/power_conditioning> ; # Power conditioning
   schema:about <http://id.loc.gov/authorities/subjects/sh85122520> ; # Silicon carbide--Electric properties
   schema:about <http://id.worldcat.org/fast/1118659> ; # Silicon carbide--Electric properties
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/n_type_semiconductors> ; # N type semiconductors
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/silicon_carbides> ; # Silicon carbides
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/tantalum> ; # Tantalum
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/electric_guns> ; # Electric guns
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/thermal_stresses> ; # Thermal stresses
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/electrical_and_electronic_equipment> ; # Electrical and Electronic Equipment
   schema:about <http://id.worldcat.org/fast/910245> ; # Energy storage
   schema:about <http://id.worldcat.org/fast/1136245> ; # Stun guns
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/guns> ; # Guns
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/metal_contacts> ; # Metal contacts
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/mfg_&_industrial_eng_&_control_of_product_sys> ; # Mfg & Industrial Eng & Control of Product Sys
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/electrical_resistance> ; # Electrical resistance
   schema:about <http://experiment.worldcat.org/entity/work/data/4160999182#Topic/metallizing> ; # Metallizing
   schema:bookFormat schema:EBook ;
   schema:contributor <http://viaf.org/viaf/149860432> ; # U.S. Army Research Laboratory.
   schema:creator <http://experiment.worldcat.org/entity/work/data/4160999182#Person/katulka_gary_l> ; # Gary L. Katulka
   schema:datePublished "1999" ;
   schema:description "The experiments described demonstrate the electrical behavior of SiC and metal ohmic-contact layers as a function of thermal stress. It has been determined from these experiments that both titanium (Ti) and tantalum (Ta) metalization structures will provide a stable electrical ohmic-contact with n-type SiC after exposure to elevated temperatures for short bursts of time that are considered relevant for pulsed-powered electric weapon technologies. The Ti-SiC structure investigated exhibited a stable current-voltage (I-V) characteristic to as much as 800 deg C for a 10-min burst, while Ta metalizations provided a stable I-V characteristic on SiC even after a temperature burst of 1,000 deg C for as long as a 3-min interval. For samples of n-type, 4H SiC, metalized with (Ti), the standard deviation in resistance (resistivity) of the measured samples is less than 0.17 ohms for a sample having an average resistance of 4.45 ohms. For the Ta contact on SiC, the standard deviation in resistance is 0.05 ohms for a sample having an average resistance of 4.25 ohms. The experiments showed that for both Ti and Ta metalized SiC samples, the change in resistivity of annealed samples is between 3.8% and 1.2% compared to the average values of sample resistance based upon the I-V measurement technique used. These results indicate the ability of Ti-SiC and Ta-SiC structures to perform in a stable manner without significant electrical degradation to the metal contact, SiC substrate, or the metal-semiconductor interface as a function of high-temperature burst conditions."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/4160999182> ;
   schema:genre "Government publication"@en ;
   schema:genre "National government publication"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/4160999182#Series/arl_tr_aberdeen_proving_ground_md> ; # ARL-TR (Aberdeen Proving Ground, Md.) ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/4160999182#Series/arl_tr> ; # ARL-TR ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/45209605> ;
   schema:name "Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns"@en ;
   schema:productID "227891956" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/227891956#PublicationEvent/aberdeen_proving_ground_md_army_research_laboratory_1999> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/4160999182#Agent/army_research_laboratory> ; # Army Research Laboratory
   schema:url <http://purl.fdlp.gov/GPO/gpo22073> ;
   schema:url <http://www.arl.army.mil/arlreports/1999/ARL-TR-1937.pdf> ;
   schema:url <http://handle.dtic.mil/100.2/ADA362521> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/227891956> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/4160999182#Agent/army_research_laboratory> # Army Research Laboratory
    a bgn:Agent ;
   schema:name "Army Research Laboratory" ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Person/katulka_gary_l> # Gary L. Katulka
    a schema:Person ;
   schema:familyName "Katulka" ;
   schema:givenName "Gary L." ;
   schema:name "Gary L. Katulka" ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Place/aberdeen_proving_ground_md> # Aberdeen Proving Ground, MD
    a schema:Place ;
   schema:name "Aberdeen Proving Ground, MD" ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Series/arl_tr> # ARL-TR ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/227891956> ; # Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns
   schema:name "ARL-TR ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Series/arl_tr_aberdeen_proving_ground_md> # ARL-TR (Aberdeen Proving Ground, Md.) ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/227891956> ; # Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns
   schema:name "ARL-TR (Aberdeen Proving Ground, Md.) ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Topic/electrical_and_electronic_equipment> # Electrical and Electronic Equipment
    a schema:Intangible ;
   schema:name "Electrical and Electronic Equipment"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Topic/electrical_resistance> # Electrical resistance
    a schema:Intangible ;
   schema:name "Electrical resistance"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Topic/mfg_&_industrial_eng_&_control_of_product_sys> # Mfg & Industrial Eng & Control of Product Sys
    a schema:Intangible ;
   schema:name "Mfg & Industrial Eng & Control of Product Sys"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/4160999182#Topic/n_type_semiconductors> # N type semiconductors
    a schema:Intangible ;
   schema:name "N type semiconductors"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85122520> # Silicon carbide--Electric properties
    a schema:Intangible ;
   schema:name "Silicon carbide--Electric properties"@en ;
    .

<http://id.worldcat.org/fast/1118659> # Silicon carbide--Electric properties
    a schema:Intangible ;
   schema:name "Silicon carbide--Electric properties"@en ;
    .

<http://id.worldcat.org/fast/1136245> # Stun guns
    a schema:Intangible ;
   schema:name "Stun guns"@en ;
    .

<http://id.worldcat.org/fast/910245> # Energy storage
    a schema:Intangible ;
   schema:name "Energy storage"@en ;
    .

<http://viaf.org/viaf/149860432> # U.S. Army Research Laboratory.
    a schema:Organization ;
   schema:name "U.S. Army Research Laboratory." ;
    .

<http://www.worldcat.org/oclc/45209605>
    a schema:CreativeWork ;
   rdfs:label "Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns" ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/227891956> ; # Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns
    .

<http://www.worldcat.org/title/-/oclc/227891956>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/227891956> ; # Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns
   schema:dateModified "2017-10-22" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.