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Evaluation of four imaging techniques for the electrical characterization of solar cells : preprint

Author: G M Berman; National Renewable Energy Laboratory (U.S.)
Publisher: [Golden, Colo.] : National Renewable Energy Laboratory, [2008]
Series: Conference paper (National Renewable Energy Laboratory (U.S.)), NREL/CP-520-44607.
Edition/Format:   eBook : Document : National government publication : English
Summary:
We evaluate four techniques that image minority-carrier lifetime, carrier diffusion length, and shunting in solar cells. The techniques include photoluminescence imaging, carrier-density imaging, electroluminescence imaging, and dark lock-in thermography shunt detection. We compare these techniques to current industry standards and show how they can yield similar results with higher resolution and in less time.
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Details

Material Type: Document, Government publication, National government publication, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: G M Berman; National Renewable Energy Laboratory (U.S.)
OCLC Number: 295151975
Notes: Title from title screen (viewed January 2, 2009).
"Presented at the 2008 Materials Research Society (MRS) Fall Meeting, Boston, Massachusetts, November 30 - December 5, 2008."
"December 2008."
Description: 6 pages : digital, PDF file.
Details: Mode of access: Internet from the NREL web site. Address as of 3/19/09: http://www.nrel.gov/docs/fy09osti/44607.pdf; current access available via PURL.
Series Title: Conference paper (National Renewable Energy Laboratory (U.S.)), NREL/CP-520-44607.
Responsibility: G.M. Berman [and others].

Abstract:

We evaluate four techniques that image minority-carrier lifetime, carrier diffusion length, and shunting in solar cells. The techniques include photoluminescence imaging, carrier-density imaging, electroluminescence imaging, and dark lock-in thermography shunt detection. We compare these techniques to current industry standards and show how they can yield similar results with higher resolution and in less time.

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