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Exploring scanning probe microscopy with Mathematica

Author: Dror Sarid
Publisher: Weinheim : Wiley-VCH, ©2007.
Edition/Format:   Print book : CD for computer : Program   Computer File : English : 2nd completely rev. and enl. edView all editions and formats
Summary:
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional  Read more...
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Material Type: Program
Document Type: Book, Computer File
All Authors / Contributors: Dror Sarid
ISBN: 9783527406173 3527406174
OCLC Number: 137248022
Notes: Previous edition: New York ; Chichester : Wiley, c1997.
Accompanied by a CD-ROM containing a Mathematica-compatible notebook (.nb file) of code for each chapter of the book.
Description: 310 pages : illustrations ; 25 cm + 1 CD-ROM (4.75 in.)
Details: System requirements for disc: any platform that supports Mathematica versions 5 and higher.
Contents: Introduction --
Uniform cantilevers --
Cantilever conversion tables --
V-shaped cantilevers --
Tip-sample adhesion --
Tip-sample force curve --
Free vibrations --
Noncontact mode --
Metal-insulator-metal tunneling --
Fowler-Norheim tunneling --
Coulomb blockade --
Density of states --
Electrostatics --
Near-field optics --
Construction and boundary resistance --
Scanning thermal conductivity microscopy --
Kelvin probe force microscopy --
Raman scattering in nanocrystals.
Responsibility: Dror Sarid.

Abstract:

This new and updated edition features a new applications section, reflecting the many breakthroughs in the field over the last years. It provides a set of computational models that describe the  Read more...

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Primary Entity

<http://www.worldcat.org/oclc/137248022> # Exploring scanning probe microscopy with Mathematica
    a schema:CreativeWork, bgn:CD, schema:Book ;
   library:oclcnum "137248022" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/548749#Place/weinheim> ; # Weinheim
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
   rdfs:comment "Unknown 'gen' value: pgm" ;
   schema:about <http://experiment.worldcat.org/entity/work/data/548749#Topic/microscopy_scanning_probe_instrumentation> ; # Microscopy, Scanning Probe--instrumentation
   schema:about <http://id.worldcat.org/fast/1106486> ; # Scanning probe microscopy--Data processing
   schema:about <http://dewey.info/class/502.825/e22/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/548749#CreativeWork/mathematica_computer_file> ; # Mathematica (Computer file)
   schema:about <http://id.worldcat.org/fast/1372712> ; # Mathematica (Computer file)
   schema:about <http://experiment.worldcat.org/entity/work/data/548749#Topic/scanning_probe_microscopy_data_processing> ; # Scanning probe microscopy--Data processing
   schema:bookEdition "2nd completely rev. and enl. ed." ;
   schema:bookFormat bgn:PrintBook ;
   schema:copyrightYear "2007" ;
   schema:creator <http://viaf.org/viaf/42999224> ; # Dror Sarid
   schema:datePublished "2007" ;
   schema:description "Introduction -- Uniform cantilevers -- Cantilever conversion tables -- V-shaped cantilevers -- Tip-sample adhesion -- Tip-sample force curve -- Free vibrations -- Noncontact mode -- Metal-insulator-metal tunneling -- Fowler-Norheim tunneling -- Coulomb blockade -- Density of states -- Electrostatics -- Near-field optics -- Construction and boundary resistance -- Scanning thermal conductivity microscopy -- Kelvin probe force microscopy -- Raman scattering in nanocrystals."@en ;
   schema:description "This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/548749> ;
   schema:inLanguage "en" ;
   schema:name "Exploring scanning probe microscopy with Mathematica"@en ;
   schema:productID "137248022" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/137248022#PublicationEvent/weinheim_wiley_vch_2007> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/548749#Agent/wiley_vch> ; # Wiley-VCH
   schema:workExample <http://worldcat.org/isbn/9783527406173> ;
   umbel:isLike <http://bnb.data.bl.uk/id/resource/GBA705964> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/137248022> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/548749#CreativeWork/mathematica_computer_file> # Mathematica (Computer file)
    a schema:CreativeWork ;
   schema:name "Mathematica (Computer file)" ;
    .

<http://experiment.worldcat.org/entity/work/data/548749#Topic/microscopy_scanning_probe_instrumentation> # Microscopy, Scanning Probe--instrumentation
    a schema:Intangible ;
   schema:name "Microscopy, Scanning Probe--instrumentation"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/548749#Topic/scanning_probe_microscopy_data_processing> # Scanning probe microscopy--Data processing
    a schema:Intangible ;
   schema:hasPart <http://id.loc.gov/authorities/subjects/sh92001586> ;
   schema:name "Scanning probe microscopy--Data processing"@en ;
    .

<http://id.worldcat.org/fast/1106486> # Scanning probe microscopy--Data processing
    a schema:Intangible ;
   schema:name "Scanning probe microscopy--Data processing"@en ;
    .

<http://id.worldcat.org/fast/1372712> # Mathematica (Computer file)
    a schema:CreativeWork ;
   schema:name "Mathematica (Computer file)" ;
    .

<http://viaf.org/viaf/42999224> # Dror Sarid
    a schema:Person ;
   schema:familyName "Sarid" ;
   schema:givenName "Dror" ;
   schema:name "Dror Sarid" ;
    .

<http://worldcat.org/isbn/9783527406173>
    a schema:ProductModel ;
   schema:isbn "3527406174" ;
   schema:isbn "9783527406173" ;
    .


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