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Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California

Autore: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
Editore: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1996.
Serie: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
Edizione/Formato:   Libro : Conference publication : EnglishVedi tutte le edizioni e i formati
Banca dati:WorldCat
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Genere/forma: Conference proceedings
Congresses
Tipo materiale: Conference publication
Tipo documento: Book
Tutti gli autori / Collaboratori: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
ISBN: 0819420573 9780819420572
Numero OCLC: 34708724
Descrizione: vii, 162 p. : ill. ; 28 cm.
Contenuti: Novel devices and fabrication processes --
Device testing and reliability --
Poster session.
Titolo della serie: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
Responsabilità: Mahmoud Fallahi, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization ARPA--Advanced Research Projects Agency.

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