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Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California

著者: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
出版: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1996.
シリーズ: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
エディション/フォーマット:   book_printbook : Conference publication : Englishすべてのエディションとフォーマットを見る
データベース:WorldCat
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ジャンル/形式: Conference papers and proceedings
Congresses
資料の種類: Conference publication
ドキュメントの種類: 図書
すべての著者/寄与者: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
ISBN: 0819420573 9780819420572
OCLC No.: 34708724
物理形態: vii, 162 pages : illustrations ; 28 cm.
コンテンツ: Novel devices and fabrication processes --
Device testing and reliability --
Poster session.
シリーズタイトル: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
責任者: Mahmoud Fallahi, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization ARPA--Advanced Research Projects Agency.

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Primary Entity

<http://www.worldcat.org/oclc/34708724> # Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "34708724" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/366148095#Place/bellingham_wash> ; # Bellingham, Wash.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/366148095#Topic/semiconductor_lasers_design_and_construction_congresses> ; # Semiconductor lasers--Design and construction--Congresses
   schema:about <http://id.worldcat.org/fast/1112171> ; # Semiconductor lasers--Design and construction
   schema:about <http://experiment.worldcat.org/entity/work/data/366148095#Topic/semiconductor_lasers_design_and_construction> ; # Semiconductor lasers--Design and construction
   schema:about <http://id.worldcat.org/fast/1112175> ; # Semiconductor lasers--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/366148095#Topic/semiconductor_lasers_testing> ; # Semiconductor lasers--Testing
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/127619765> ; # Society of Photo-optical Instrumentation Engineers.
   schema:contributor <http://viaf.org/viaf/276839861> ; # Mahmoud Fallahi
   schema:contributor <http://experiment.worldcat.org/entity/work/data/366148095#Person/wang_s_c_shing_chung_1934> ; # Shing Chung Wang
   schema:contributor <http://experiment.worldcat.org/entity/work/data/366148095#Organization/united_states_advanced_research_projects_agency> ; # United States. Advanced Research Projects Agency.
   schema:copyrightYear "1996" ;
   schema:datePublished "1996" ;
   schema:description "Novel devices and fabrication processes -- Device testing and reliability -- Poster session."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/366148095> ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:genre "Conference publication"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/366148095#Series/proceedings_of_spie_the_international_society_for_optical_engineering> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/366148095#Series/spie_proceedings_series> ; # SPIE proceedings series ;
   schema:name "Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California"@en ;
   schema:productID "34708724" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/34708724#PublicationEvent/bellingham_wash_society_of_photo_optical_instrumentation_engineers_1996> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/366148095#Agent/society_of_photo_optical_instrumentation_engineers> ; # Society of Photo-optical Instrumentation Engineers
   schema:workExample <http://worldcat.org/isbn/9780819420572> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/34708724> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/366148095#Agent/society_of_photo_optical_instrumentation_engineers> # Society of Photo-optical Instrumentation Engineers
    a bgn:Agent ;
   schema:name "Society of Photo-optical Instrumentation Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/366148095#Organization/united_states_advanced_research_projects_agency> # United States. Advanced Research Projects Agency.
    a schema:Organization ;
   schema:name "United States. Advanced Research Projects Agency." ;
    .

<http://experiment.worldcat.org/entity/work/data/366148095#Person/wang_s_c_shing_chung_1934> # Shing Chung Wang
    a schema:Person ;
   schema:birthDate "1934" ;
   schema:familyName "Wang" ;
   schema:givenName "Shing Chung" ;
   schema:givenName "S. C." ;
   schema:name "Shing Chung Wang" ;
    .

<http://experiment.worldcat.org/entity/work/data/366148095#Place/bellingham_wash> # Bellingham, Wash.
    a schema:Place ;
   schema:name "Bellingham, Wash." ;
    .

<http://experiment.worldcat.org/entity/work/data/366148095#Series/proceedings_of_spie_the_international_society_for_optical_engineering> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/34708724> ; # Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
   schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/366148095#Series/spie_proceedings_series> # SPIE proceedings series ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/34708724> ; # Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
   schema:name "SPIE proceedings series ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/366148095#Topic/semiconductor_lasers_design_and_construction> # Semiconductor lasers--Design and construction
    a schema:Intangible ;
   schema:hasPart <http://id.loc.gov/authorities/subjects/sh85119896> ;
   schema:name "Semiconductor lasers--Design and construction"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/366148095#Topic/semiconductor_lasers_design_and_construction_congresses> # Semiconductor lasers--Design and construction--Congresses
    a schema:Intangible ;
   schema:name "Semiconductor lasers--Design and construction--Congresses"@en ;
    .

<http://id.worldcat.org/fast/1112171> # Semiconductor lasers--Design and construction
    a schema:Intangible ;
   schema:name "Semiconductor lasers--Design and construction"@en ;
    .

<http://id.worldcat.org/fast/1112175> # Semiconductor lasers--Testing
    a schema:Intangible ;
   schema:name "Semiconductor lasers--Testing"@en ;
    .

<http://viaf.org/viaf/127619765> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
   schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://viaf.org/viaf/276839861> # Mahmoud Fallahi
    a schema:Person ;
   schema:familyName "Fallahi" ;
   schema:givenName "Mahmoud" ;
   schema:name "Mahmoud Fallahi" ;
    .

<http://worldcat.org/isbn/9780819420572>
    a schema:ProductModel ;
   schema:isbn "0819420573" ;
   schema:isbn "9780819420572" ;
    .

<http://www.worldcat.org/title/-/oclc/34708724>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/34708724> ; # Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
   schema:dateModified "2016-05-11" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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