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Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California 線上預覽
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Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California

作者: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
出版商: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1996.
叢書: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
版本/格式:   圖書 : 會議刊物 : 英語所有版本和格式的總覽
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類型/形式: Conference proceedings
Congresses
資料類型: 會議刊物
文件類型: 圖書
所有的作者/貢獻者: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
ISBN: 0819420573 9780819420572
OCLC系統控制編碼: 34708724
描述: vii, 162 p. : ill. ; 28 cm.
内容: Novel devices and fabrication processes --
Device testing and reliability --
Poster session.
叢書名: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
責任: Mahmoud Fallahi, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization ARPA--Advanced Research Projects Agency.

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<http://www.worldcat.org/oclc/34708724>
library:oclcnum"34708724"
library:placeOfPublication
library:placeOfPublication
owl:sameAs<info:oclcnum/34708724>
rdf:typeschema:Book
schema:about
<http://id.worldcat.org/fast/1112171>
rdf:typeschema:Intangible
schema:name"Semiconductor lasers--Design and construction"@en
schema:about
schema:about
<http://id.loc.gov/authorities/subjects/sh85119896>
rdf:typeschema:Intangible
schema:name"Semiconductor lasers--Testing"@en
schema:name"Semiconductor lasers--Design and construction"@en
schema:about
<http://id.worldcat.org/fast/1112175>
rdf:typeschema:Intangible
schema:name"Semiconductor lasers--Testing."@en
schema:name"Semiconductor lasers--Testing"@en
schema:contributor
<http://viaf.org/viaf/151856603>
rdf:typeschema:Organization
schema:name"Society of Photo-optical Instrumentation Engineers."
schema:contributor
<http://viaf.org/viaf/154230733>
rdf:typeschema:Organization
schema:name"United States. Advanced Research Projects Agency."
schema:contributor
schema:contributor
schema:copyrightYear"1996"
schema:datePublished"1996"
schema:description"Novel devices and fabrication processes -- Device testing and reliability -- Poster session."@en
schema:exampleOfWork<http://worldcat.org/entity/work/id/366148095>
schema:genre"Conference proceedings."@en
schema:genre"Conference proceedings"@en
schema:inLanguage"en"
schema:name"Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California"@en
schema:numberOfPages"162"
schema:publisher
schema:url
schema:workExample

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