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Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California

Author: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
Publisher: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©1996.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Advanced Research Projects Agency.
ISBN: 0819420573 9780819420572
OCLC Number: 34708724
Description: vii, 162 pages : illustrations ; 28 cm.
Contents: Novel devices and fabrication processes --
Device testing and reliability --
Poster session.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 2683.
Responsibility: Mahmoud Fallahi, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization ARPA--Advanced Research Projects Agency.

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