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Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California

Author: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Defense Advanced Research Projects Agency.
Publisher: Bellingham, Washington : SPIE, ©1997.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 3004.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Mahmoud Fallahi; S C Wang; Society of Photo-optical Instrumentation Engineers.; United States. Defense Advanced Research Projects Agency.
ISBN: 0819424153 9780819424150
OCLC Number: 37004971
Description: v, 176 pages : illustrations ; 28 cm.
Contents: Novel devices and fabrication processes --
Device testing and reliability.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 3004.
Responsibility: Mahmoud Fallahi, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization DARPA--Defense Advanced Research Projects Agency.

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