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Failure mechanisms in semiconductor devices

Author: E A Amerasekera; D S Campbell
Publisher: Chichester [West Sussex] ; New York : Wiley, ©1987.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

A straightforward and accessible approach to the subject of failure in electronic components, centering largely around semiconductor devices.

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: E A Amerasekera; D S Campbell
ISBN: 0471914347 9780471914341
OCLC Number: 14718252
Notes: Includes indexes.
Description: xiii, 205 pages : illustrations ; 24 cm
Contents: Machine derived contents note: Reliability Mathematics. --
Principal Failure Mechanisms. --
Failure Mechanisms in Technologies and Circuits. --
Reliability Testing. --
Reliability Prediction. --
Screening. --
Failure Analysis. --
Quality Assurance. --
Appendix. --
Indexes.
Responsibility: E.A. Amerasekera and D.S. Campbell.
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